Conductive solid nondestructive detection circuit and continuous stress quantitative evaluation method based on conductive solid nondestructive detection circuit

A technology of non-destructive testing and quantitative evaluation, which is applied in the measurement of the property force of piezoresistive materials, the magnetic variables of materials, etc., to achieve the effect of ensuring safety

Inactive Publication Date: 2017-09-08
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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[0010] (2) pi...

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  • Conductive solid nondestructive detection circuit and continuous stress quantitative evaluation method based on conductive solid nondestructive detection circuit
  • Conductive solid nondestructive detection circuit and continuous stress quantitative evaluation method based on conductive solid nondestructive detection circuit
  • Conductive solid nondestructive detection circuit and continuous stress quantitative evaluation method based on conductive solid nondestructive detection circuit

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[0058] In order to facilitate those skilled in the art to understand the technical content of the present invention, the content of the present invention will be further explained below in conjunction with the accompanying drawings.

[0059] Such as figure 2 Shown is a schematic diagram of a modularized circuit for the quantitative evaluation method of the continuously distributed stress of a conductive solid; the technical solution of the present application is: a conductive solid non-destructive testing circuit, including: a detection probe, a test piece, a second module, and a third module; The detection probe is fixed on the surface of the tested object; the detection probe includes at least: a first module, an excitation coil and a magnetic sensor; the first module is used to generate a fixed-frequency sinusoidal excitation signal to provide an accurate excitation signal for the excitation coil; After the excitation signal is input into the excitation coil, a coupled ele...

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Abstract

The invention discloses a conductive solid nondestructive detection circuit and a continuous stress quantitative evaluation method based on the conductive solid nondestructive detection circuit. The method comprises the following steps: acquiring nondestructive detection signals through a conductor nondestructive detection circuit; conducting quantitative evaluation on the continuous stress distribution of the conductive solid by an experiment and numerical simulation combined mode; specifically, determining the relation between the nondestructive detection signals and external loads through experiments; acquiring the distribution law of conductivity through the piezoresistive effect, and acquiring the relation between continuous stress distribution and the external loads through a numerical calculation model; and acquiring the stress of any one point of the conductor according to the estimated magnitude of the external force, thereby realizing quantitative evaluation of the continuous stress distribution of the conductive solid. The method disclosed by the invention lays the foundation for early damage prediction of the conductive solid, can be used for realizing fitness prediction of conductor and semiconductor key members, and is of great importance in guaranteeing the safety of key structures.

Description

technical field [0001] The invention belongs to the field of non-destructive detection of conductive solid stress, in particular to a continuous stress detection technology. Background technique [0002] As a common component in engineering practice, (semi)conductive solid components are widely used in key equipment in many engineering fields such as transportation, aerospace, nuclear energy, and electric power. Their safety and durability have an important impact on the performance of key equipment. However, (semi) conductive solid components will inevitably produce processing residual stress in the manufacturing process under the condition of cold working, and will produce welding residual stress and stress concentration in the installation process. The non-uniform stress distribution of the above (semi) conductive solid components will affect the performance and safety of metal components: on the one hand, the non-uniform distribution of stress will lead to non-negligible...

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Application Information

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IPC IPC(8): G01N27/83G01L1/18
CPCG01N27/83G01L1/18
Inventor 于亚婷李翰超王振伟高宽厚袁飞杜平安田贵云
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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