Image splicing method based on SIFT feature point matching
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 重庆信科设计有限公司
- Publication Date
- 2017-09-12
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to an image splicing method, in particular to an image splicing method based on SIFT feature point matching, and belongs to the technical field of image processing. Background technique
[0002] Image stitching is to fuse multiple images with a certain overlap to synthesize a high-resolution image with a wide field of view and no obvious stitching gaps. At present, image stitching technology has gradually become a research hotspot, and it is widely used in computer image processing, seabed exploration, medical image, virtual reality, remote sensing image processing and other fields.
[0003] The methods of image stitching can be basically divided into the following two types: methods based on gray information and methods based on features. The method based on grayscale information calculates the similarity of two images by using the pixel values of the image to be stitched, so as to determine the overlapping area of stitching...