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Linear array structured light three-dimensional rapid measuring device and measuring method

A measuring device and structured light technology, applied in the direction of measuring devices, optical devices, instruments, etc.

Inactive Publication Date: 2017-09-15
浙江四点灵机器人股份有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In the prior art, there has not been a simple and quick method for measuring the three-dimensional contour of the surface of an object by combining linear array structured light with the look-up table method. The present invention solves such a problem

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  • Linear array structured light three-dimensional rapid measuring device and measuring method
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  • Linear array structured light three-dimensional rapid measuring device and measuring method

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Embodiment Construction

[0037] The following describes the present invention in detail with reference to the drawings and specific embodiments.

[0038] A linear array structured light three-dimensional rapid measurement device includes: a reference plane for placing an object to be measured, an image collector, a checkerboard calibration board for calibrating the image collector, and a linear array structured light placed on the reference plane. As a preference, the image collector is a monocular camera, and when the measurement accuracy is 0.2mm, the pixel size of the camera is required to be at least 5um. When the accuracy is higher, the pixel needs to be smaller.

[0039] As an embodiment, the linear array structured light is generated by a linear array laser; the linear array structured light can also be a projection image generated by a projector as a light source; the linear array structured light can also be a diffraction image generated through a grating.

[0040] The angle range between the centra...

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Abstract

The invention discloses a linear array structured light three-dimensional rapid measuring device and measuring method, and through utilization of principles of linear array structured light and a look-up table, object surface three-dimensional profile measurement is completely easily, conveniently and rapidly. First a traditional calibration method is utilized to obtain internal parameters and distortion parameters of a camera; linear array structured light images of different spatial heights are collected, and calibration parameters are utilized to perform distortion correction on the images; then interpolation calculation is utilized to obtain a corresponding relation between an image coordinate position and height of each laser ray, and a corresponding retrieval table is generated and stored; the look-up table only needs to be generated once, a relative position of the camera and a light source is kept unchanged, when another object is measured, a user only needs to put the object to be measured on a datum plane, and an image collect is utilized to obtain an image of linear array structure light on the surface on the object to be measured; image processing is utilized to obtain the image coordinate of the laser ray, and depth information of the laser ray can be obtained by directly searching the retrieval table; and thus the three-dimensional profile of the object is rapidly restored.

Description

Technical field [0001] The invention relates to the field of three-dimensional detection and three-dimensional reconstruction, in particular to a method for three-dimensional rapid measurement of linear array structured light. Background technique [0002] Three-dimensional measurement technology is a technology to obtain the spatial coordinates of each point on the surface of the object to be measured. The three-dimensional model reflects the true shape of the object very well, and the rapid three-dimensional measurement technology has great application prospects in many fields such as military, cultural relics, medicine, education, and industrial inspection. [0003] Three-dimensional measurement technology has a long history, and the technology has matured day by day. The commonly used three-dimensional measurement methods are contact and non-contact. The representative contact measurement techniques mainly include CMM (three coordinate measuring machine), tomography and tomogr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/005
Inventor 林斌杨晨
Owner 浙江四点灵机器人股份有限公司
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