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LED integrated driving power reliability analysis method based on accelerated performance degradation parameter

A technology that accelerates performance degradation and integrates drivers. It is applied in the fields of environment/reliability testing, power supply testing, and electrical measurement. It can solve the problem that the selected parameters are not representative of the whole, the results of the LED integrated drive power cannot be obtained, and there is a lack of actual engineering. Application background and other issues to achieve the effect of improving reliability

Inactive Publication Date: 2017-10-10
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] To sum up, the existing driving power reliability analysis method lacks the actual engineering application background, and the selected parameters are not representative of the whole problem, so it is impossible to obtain the influence result of the LED integrated driving power in the whole lamp life

Method used

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  • LED integrated driving power reliability analysis method based on accelerated performance degradation parameter
  • LED integrated driving power reliability analysis method based on accelerated performance degradation parameter
  • LED integrated driving power reliability analysis method based on accelerated performance degradation parameter

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Embodiment Construction

[0020] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0021] The present invention provides a reliability analysis method of LED integrated drive power supply based on accelerated performance degradation parameters, and improves the model and parameter identification method in combination with engineering practice to realize the reliability analysis of LED integrated drive power supply and the analysis of the impact on the life of the whole lamp. Specific steps are as follows:

[0022] 1) Accelerated performance degradation parameter selection

[0023] The selection of accelerated performance degradation parameters is based on the long-term recorded data of the accelerated test and the short-term recorded data under single-temperature stress of each intensity. The short-term data recording is to obtain the relationship between the applied stress intensity and the board-level output parameters, a...

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Abstract

The invention relates to a reliability analysis method in the field of accelerated degradation testing, and in particular to a method based on accelerated degradation electrical parameter for analyzing the reliability of a LED integrated driving power within a LED entire light life cycle based on luminous flux. The method aims at using an electrical parameter to analyze the reliability of the LED integrated driving power so as to obtain the result of influence on the lifecycle of the entire lamp by the driving power. The reliability research for the driving power is based on design perspective. According to the invention, the method aims at addressing the problem of reliability analysis of the integrated driving power within the entire life cycle of the LED lamp, establishes a Wiener-based statistic model in accordance with the accelerated degradation electrical parameter, and conducts model parameter identification in combination with the maximum likelihood method and the MCMC method. The improved identification method reduces sampling requirements with the proviso of better protecting the identification precision by improving the identification method. And eventually, the method can provide a reliability index of the LED integrated driving power within the life cycle of the entire lamp in accordance with the constraints of the life cycle of the entire LED lamp based on luminous flux.

Description

technical field [0001] The invention relates to a reliability analysis method in the field of accelerated degradation test, in particular to a reliability analysis method for LED integrated drive power supply based on accelerated performance degradation parameters Background technique [0002] LEDs are widely used, and LED reliability analysis is very important in the promotion of LED applications. As a part of the LED lighting system, the reliability of the integrated driving power supply is directly related to the performance of the LED. Therefore, research on the reliability of integrated drive power has become an unavoidable topic in this field. [0003] The integrated drive power supply is a highly integrated system consisting of integrated sub-modules and a small number of discrete components. Most of the existing research is based on the reliability analysis of a single component, and does not involve specific engineering application background. On the one hand, th...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/40G06F17/50
CPCG01R31/003G01R31/40G06F30/20
Inventor 孙强荆雷田彦涛高群栗阳
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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