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62 results about "Reliability study" patented technology

A Reliability Study is a systematic study for the preventive maintenance that results in the more reliable outputs and end products.

Device architecture and process for improved vertical memory arrays

An array process diagnosis test structure for an integrated circuit including a transistor array composed of vertical FET memory cell access transistors, which are formed into the depth of a substrate in the form of active webs which run parallel in the lateral direction of the circuit is disclosed. Memory cell storage capacitors in the array test structure are formed in deep trenches on the end faces of those sections of the active webs which form the vertical FET transistors. Word lines are arranged along the webs and along parallel intersecting bit lines of the array, outside of which, and on two mutually opposite edges, are located a first and second word line comb. The wordline combs are offset and connected alternately to different word lines. In addition, a first and a second bit line comb are formed on the two other opposing edges of the transistor array mutually offset and each connected to different bit lines. The test structure provides a convenient means to carry out reliability investigations on the gate oxide of the vertical FET transistors and on the capacitor dielectric in the deep trenches, capacitance measurements between the word lines, and between the word lines and other circuit layers, as well as capacitance measurements between the bit lines and between the bit lines and other circuit layers, and thus facilitates diagnosis of possible fault sources arising during the production process.
Owner:POLARIS INNOVATIONS

Simulation device and method of characters of merging unit of intelligent transformer substation

ActiveCN103616591ASolving difficult-to-implement simulation problemsProgramme controlComputer controlElectric power systemDigital signal
The invention relates to dynamic simulation devices and methods for all voltage grades of a power system, in particular to a simulation device and method of the characters of a merging unit of an intelligent transformer substation. The simulation device accords with a DL / T860 communication protocol and has the functions that secondary signals of multiple traditional voltage mutual inductors and current mutual inductors are received; the secondary signals are converted into digital light signals which accord with the DL / T860.92 and the GB / T 20840.8; all characters of the merging unit can be simulated at the same time, wherein the characters comprise the synchronizing and desynchronizing character, frame loss, delay, delay deviation and delay jitter of sampling valve messages, and sampling frequency deviation and jitter; the synchronous mark, the state character and the quality place of the sampling valve messages can be modified in real time, and the sampling valve deviation and superimposed harmonic components can be simulated. The simulation device and method solve the problem that simulation can not be achieved easily for abnormal conditions of the electronic mutual inductors and the merging unit in the dynamic simulation process of the intelligent transformer substation, and can be widely applied to reliability research and testing of secondary equipment of the intelligent transformer substation.
Owner:STATE GRID CORP OF CHINA +2

LED integrated driving power reliability analysis method based on accelerated performance degradation parameter

The invention relates to a reliability analysis method in the field of accelerated degradation testing, and in particular to a method based on accelerated degradation electrical parameter for analyzing the reliability of a LED integrated driving power within a LED entire light life cycle based on luminous flux. The method aims at using an electrical parameter to analyze the reliability of the LED integrated driving power so as to obtain the result of influence on the lifecycle of the entire lamp by the driving power. The reliability research for the driving power is based on design perspective. According to the invention, the method aims at addressing the problem of reliability analysis of the integrated driving power within the entire life cycle of the LED lamp, establishes a Wiener-based statistic model in accordance with the accelerated degradation electrical parameter, and conducts model parameter identification in combination with the maximum likelihood method and the MCMC method. The improved identification method reduces sampling requirements with the proviso of better protecting the identification precision by improving the identification method. And eventually, the method can provide a reliability index of the LED integrated driving power within the life cycle of the entire lamp in accordance with the constraints of the life cycle of the entire LED lamp based on luminous flux.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Finite element modeling method for simulating failure short-circuit mechanism of pressing connection type IGBT device

ActiveCN107679353AAccurately reflect changes in characteristic parametersReflect changes in characteristic parametersDesign optimisation/simulationSpecial data processing applicationsElement modelingFeature parameter
The invention relates to a finite element modeling method for simulating a failure short-circuit mechanism of a pressing connection type IGBT device and belongs to the field of large-power semiconductor device failure mechanisms and reliability research. The modeling method comprises the steps that a pressing connection type IGBT failure short-circuit process is simulated, a pressing connection type IGBT device equivalent model of a penetrating pit which is formed by a failure short circuit is built, and the content of aluminum element in the penetrating pit is set, so that the material attribute change of different failure short-circuit processes is formed; the pressing connection type IGBT device is subjected to modeling in a multi-physics field, a pressing connection type IGBT device geometric model is built, and based on the material attribute change of different failure short-circuit processes, the change rules of resistance and thermal resistance in different failure short-circuit processes are subjected to circulating simulation and analog. According to the finite element modeling method, finite element modeling and analysis in the failure short-circuit process of the pressing connection type IGBT device are achieved, a failure short-circuit equivalent model of the penetrating pit is considered, the change of characteristic parameters in the failure short-circuit processof the pressing connection type IGBT device is simulated, and the basis can be provided for failure short-circuit state monitoring of the pressing connection type IGBT device.
Owner:CHONGQING UNIV

Novel multi-factor tactical internet connection reliability simulation method

ActiveCN103745049AImprove the degree of perfectionSolve problemsData switching networksSpecial data processing applicationsTerrainInternet reliability
The invention relates to a novel multi-factor tactical internet connection reliability simulation method which solves the problem that complex movement modes and terrain environments cannot be comprehensively considered in the research process of tactical internet connection reliability. The method includes the steps: designing and building simulation network scenes in an OPNET, generating combat movement modes by the aid of a two-dimensional normal cloud model, adding the movement modes into the network scenes, adding business operation simulation, collecting simulation data in different movement modes and analyzing the simulation data to obtain a connection reliability curve; newly building same network scenes, adding real terrain data to obtain a connection reliability curve under terrain influence, and researching the influence of the real terrain environments on the network connection reliability. The method improves modeling of the movement modes and the terrain environments in network connection reliability research, solves the problem of difficulty in modeling the complex environments in networks and the movement modes, and builds a foundation for the research of complex factors of tactical internet reliability research.
Owner:BEIHANG UNIV

Electronic type current mutual inductor fault identification method based on waveform inversion

The invention provides an electronic type current mutual inductor fault identification method based on waveform inversion, which aims to solve the problem existed in an electronic current type mutualinductor fault judgment based on the rogowski coil principle in an existing electric power system. The method comprises the steps that an instantaneous current sudden change amount is input into an input end of an electronic type current mutual inductor, and the output waveform of the output end of the electronic type current mutual inductor is sampled; whether the output waveform is distorted ornot can be determined, whether a system fault except the fault of the non-electronic current type current mutual inductor exists or not can be determined; when the output waveform is distorted, the output waveform is subjected to differential re-integration inversion operation, and when the inversion fails, it is determined that the electronic type current mutual inductor has a fault. According tothe method, the fault points can be accurately positioned according to the inverted waveform features, and technical support can be provided for reliability research and digital relay protection of the electronic type current mutual inductor, and technical support can be provided for the applicability of the electronic type current mutual inductor.
Owner:ELECTRIC POWER RES INST OF STATE GRID ANHUI ELECTRIC POWER +2

System fuzzy reliability analysis method based on fuzzy dynamic Bayesian network

ActiveCN110955227AAccurate Reliability EvaluationElectric testing/monitoringAlgorithmData information
The invention discloses a system fuzzy reliability analysis method based on a fuzzy dynamic Bayesian network, and the method comprises the steps: obtaining an SADT graph based on a structural analysisand design method; evaluating a possible fault mode of the system based on the fault mode and an influence analysis method; constructing a DBN model of the system in combination with the SADT graph and a fault mode and influence analysis method; obtaining a conditional probability table and a state transition matrix based on a Markov chain, and introducing a fuzzy set theory according to the obtained DBN model of the system; combining a conditional probability table and a state transition matrix to complete the model construction of the fuzzy DBN of the system; and on the basis of the constructed fuzzy DBN model, based on Bayesian reasoning, adopting MATLAB software for simulation to acquire a result of system reliability analysis. According to the invention, reliability research can be carried out on equipment which is stored in a design analysis stage for a long time and lacks data information; reliability research can be carried out on large aircraft equipment, complex structures and multi-fault-mode products; accurate reliability evaluation can be obtained from engineering fuzzy information.
Owner:XIDIAN UNIV
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