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A Test System for Devices on Braid

A technology of braiding and devices, which is applied in the field of testing systems for devices on braiding, can solve problems such as low test efficiency, difficulty in retesting, long device testing process, etc., and achieve the effect of improving test efficiency

Active Publication Date: 2019-11-15
WUXI CHINA RESOURCES HUAJING MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when electronic devices have been taped, it is difficult to retest on the original automatic sorter equipment. Generally, it is necessary to manually test the taped devices, and the device testing process will take a long time. , the test efficiency is low

Method used

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  • A Test System for Devices on Braid
  • A Test System for Devices on Braid
  • A Test System for Devices on Braid

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] Figure 1A It is a structural schematic diagram of a testing system for devices on a braid provided in Embodiment 1 of the present invention. The testing system 10 for the device on the tape includes:

[0028] Braiding transmission device 11, test claw 15, linkage device 17, test board 18 and test controller 19;

[0029] The braid transmission device 11 is used to transmit the braid to the test;

[0030] The test claw 15 is set opposite to the test board 18;

[0031] The linkage device 17 is used to push the test claw 15 to move towards the test board 18 when moving back and forth, so that the test claw 15 interferes with the pins of the device on the braid on the test board 18;

[0032] The test claw 15 is electrically connected to the test controller 19 through a test line, and is used for providing test signals to the device.

[0033] Wherein, the linkage device 17 can be driven by a driving motor to move back and forth, and the driving motor can be controlled by ...

Embodiment 2

[0054] Figure 2A It is a schematic structural diagram of a testing system for devices on a braid provided in Embodiment 2 of the present invention. see Figure 2A , on the basis of the first embodiment above, the system 10 further includes: a tape feed guide wheel 20, a tape feed tensioning device 21 and a take-up pulley 22;

[0055] The tape feed guide wheel 20 is used to control the direction and angle at which the braid enters the indexing gear plate 111;

[0056] The tape advance tensioning device 21 is used to tighten the moving braid;

[0057] Described take-up wheel 22 is used for income braiding.

[0058] Further, see Figure 2B , the belt-feeding tensioning device 21 includes:

[0059] A first fixed block 211 and a second fixed block 212, the second fixed block 212 is an L-shaped block;

[0060] The first fixing block 211 is fixed on the first inner side of the second fixing block 212, and there is a certain gap 213 between the second fixing block 212 and the s...

Embodiment 3

[0066] Figure 3A It is a schematic structural diagram of a testing system for devices on braid provided in Embodiment 3 of the present invention, see Figure 3A , on the basis of the foregoing embodiments, the system further includes:

[0067] Optical fiber sensor 24 and device rejecting device 25;

[0068] The optical fiber sensor 24 is electrically connected to the braiding controller 113, and is used to detect whether the test claw 15 is in contact with the pins of the device on the braiding;

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PUM

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Abstract

The embodiment of the present invention discloses a test system for devices on braids. The test system comprises a braid conveying device, a test claw, a fastening device, a linkage device, a test board and a test controller, wherein the braid conveying device is used to convey braid s to the test board; the test pawl is disposed opposite to the test board; the linkage device is used for pushing the test claw to move toward the test board when moving forward and backward so that the test claw presses against the pins of the devices on the braids on the test board; and the test pawl is electrically connected to the test controller through a test circuit for providing test signals to the devices. According to the technical solutions provided in the embodiments of the present invention, automatic test of the devices on braids can be realize. The test system is convenient and quick and improves the efficiency for testing devices on braids.

Description

technical field [0001] The embodiment of the present invention relates to the technical field of detection, and in particular to a testing system for devices on a braid. Background technique [0002] After the electronic device is formed, such as a triode, it is generally taped by a braiding machine. [0003] Existing braiding machine mainly comprises product guide rail, indexing gear plate, the cover plate that is positioned at the indexing gear plate, product forming device, product positioning device and product rejecting device. The product guide rail sends the electronic components one by one between the indexing gear plate and the cover plate. As the indexing gear plate rotates, the tin foil belt rotates with the indexing gear plate. When the device moves to the product forming device, the product is formed. The device processes the pins of the device to open the pins of the device. Then, the device is processed on the product positioning device and glued to the tin f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/01G01R1/02
CPCG01R1/02G01R31/01
Inventor 周建军孙友权
Owner WUXI CHINA RESOURCES HUAJING MICROELECTRONICS