Power chip testing system and power chip testing method

Abstract

The invention discloses a power chip testing system, which comprises a to-be-tested power chip, a DC source module for providing working voltage for the to-be-tested power chip, a current testing module for testing input current of the to-be-tested power chip under different testing states, a load module for providing target load for the to-be-tested power chip, a voltage testing module for testing output voltage of the to-be-tested power chip under different testing states and an upper computer connected with the DC source module, the current testing module, the load module and the voltage testing module for controlling and managing the whole to-be-tested power chip testing process. The invention also discloses a power chip testing method. Automatic linear adjustment test and load adjustment test can be carried out on the tested power chip, input current data and output voltage data can be acquired automatically, and the complete testing data information can be recorded and outputted.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a power chip testing system and method. Background technique [0002] In the test of integrated circuits, in order to ensure the stability of the power chip, various operating parameters of the power chip are often tested. [0003] Existing power supply test solutions are mainly used to solve the mass production test of high-power switching power supply on the production line. For the test of power chip, the cost of the complete system is very expensive, and the software and hardware configuration is redundant. Therefore, when testing the power supply chip, it is necessary to use manual testing method, while adjusting the input voltage and load size, while recording the input current and output voltage, assuming that there are more than 9 samples, 4 kinds of temperature conditions, and more than 4 input In the case of voltage conditions and about 6 load conditions, at l...

AI Technical Summary

Problems solved by technology

[0003] Existing power supply test solutions are mainly used to solve the mass production test of high-power switching power supply on the production line. For the test of power chip, the cost of the complete system is very expensive, and the software and hardware configuration is redundant.

Therefore, when testing the power supply chip, it is necessary to use manual testing method, while adjusting the input voltage and load size, while recording the input current and output voltage, assuming that there are more than 9 samples, 4 kinds of temperature conditions, and more than 4 input Under voltage conditions and about 6 load conditions, at least 864 input current data and 864 output voltage data need to be tested and recorded, which is undoubtedly a huge workload

Moreover, it is inevitable that some data records are wrong in manual testing, which affects the subsequent data analysis work.

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