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Method for measuring surface charge distribution of nano structure

A nanostructure and surface charge technology, applied in the field of nanometers, can solve the problems of high cost, complex structure of observation instruments, not very easy to operate, etc., and achieve the effect of low cost

Active Publication Date: 2017-11-28
TSINGHUA UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the structure of the above-mentioned observation instruments is complex, the operation is not very easy, and it takes a long time and the cost is high

Method used

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  • Method for measuring surface charge distribution of nano structure
  • Method for measuring surface charge distribution of nano structure
  • Method for measuring surface charge distribution of nano structure

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Embodiment Construction

[0034] The present invention will be further elaborated below in conjunction with the accompanying drawings and embodiments.

[0035] The present invention will be further elaborated below in conjunction with the accompanying drawings and embodiments.

[0036] Please also refer to figure 1 and figure 2 , the first embodiment of the present invention provides a method for observing the surface charge distribution of nanostructures, comprising the following steps:

[0037] S11, providing a sample to be tested 60, the sample to be tested 60 has a nanostructure, and the sample to be observed is arranged on the surface of an insulating substrate 610;

[0038] S12, spraying first charged nanoparticles 620 onto the surface of the sample 60 to be tested;

[0039] S13, inject steam into the surface of the sample to be tested 60, use the optical microscope 10 to observe the distribution of the first charged nanoparticles 620 around the sample to be tested 60, and judge the surface o...

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Abstract

The invention discloses a method for observing surface charge distribution of a nano structure. The method comprises the following steps: S1, providing a to-be-observed sample, wherein the to-be-observed sample is arranged on the surface of an insulated substrate; S2, forming a layer of electrified nano-particles on the surface and at the periphery of the to-be-observed sample; S3, introducing vapor into the surface of the to-be-observed sample; and S4, observing the distribution condition of the electrified nano-particles around the to-be-observed sample by utilizing an optical microscope, and judging the surface charge distribution of the to-be-observed sample. According to the method provided by the invention, the surface charge distribution condition of the nano-structure can be efficiently and conveniently obtained at low cost.

Description

technical field [0001] The invention belongs to the field of nanotechnology, and relates to a method for measuring the distribution of charges on the surface of nanostructures. Background technique [0002] Nanostructure usually refers to a tiny structure with a size below 100nm, that is, a new system is built or assembled according to certain rules based on nanoscale material units. Nanotechnology is a science and technology based on many modern advanced science and technology. Its purpose is to study the design method, composition, characteristics and application of substances and equipment at the nanoscale. It is currently used in materials and preparation, microelectronics and computer technology, and medicine. There are many important applications in fields such as health, aerospace and aviation, environment and energy, biotechnology and agricultural products. Surface charge is the charge that exists at the interface. In the prior art, electrostatic force microscopy (...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/00
CPCG01N21/00G01R29/14G01R5/28G01R15/165G01R19/0023G01R29/12G01R29/24G01R33/10
Inventor 王江涛金翔柳鹏魏洋姜开利范守善
Owner TSINGHUA UNIV
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