Circuit and method for measuring length of single-particle turning transient pulse

A technology of single-event flipping and transient pulses, which is applied in the measurement of pulse characteristics, etc., can solve the problems of inverter delay errors, manufacturing process deviations, etc., and achieve the effect of improving detection accuracy and reducing hardware resources

Pending Publication Date: 2017-12-01
CHENGDU UNIV OF INFORMATION TECH +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Moreover, due to the deviation of the manufacturing process, there will be errors in the delay of each stage of inverter

Method used

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  • Circuit and method for measuring length of single-particle turning transient pulse
  • Circuit and method for measuring length of single-particle turning transient pulse
  • Circuit and method for measuring length of single-particle turning transient pulse

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Embodiment Construction

[0047] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0048] Any feature disclosed in this specification, unless specifically stated, can be replaced by other alternative features that are equivalent or have similar purposes. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0049] The invention controls the counting start and stop counting of the counter through the change of the detected single event transient pulse from low to high and from high to low, and multiplies the counting result of the counter with the counting clock cycle to obtain the single particle in the signal to be tested. Length of the toggle transient pulse (measured in time).

[0050] include:

[0051] Step 1: Start counting when detecting the first type of jump edge of the signal to be tested;

...

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PUM

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Abstract

The invention discloses a circuit and a method for measuring the length of a single-particle turning transient pulse and aims to provide a circuit and a method for measuring the length of a single-particle turning transient pulse by adopting a counter, wherein the number of electronic components is reduced and the measuring precision is improved. According to the technical point of the invention, the circuit comprises a counting circuit, a controller and a clock circuit. The clock circuit is used for providing a counting clock to the counting circuit. The counting circuit is used for receiving a to-be-detected signal, starting the counting operation upon detecting the first-type jumping edge of the to-be-detected signal, and stopping the counting operation upon detecting the second-type jumping edge of the to-be-detected signal, wherein the first-type jumping edge and the second-type jumping edge are opposite to each other. The controller is used for receiving the counting result of the counting circuit. The product of the counting result and the period of the counting clock is calculated to obtain the length of the single-particle turning transient pulse.

Description

technical field [0001] The invention relates to a circuit and a method for measuring the length of a single-event inversion transient pulse, in particular to a circuit and a method for measuring the length of a single-event inversion transient pulse in a high-energy particle radiation environment by using a counter counting method. Background technique [0002] When the integrated circuit is exposed to high-energy particle radiation environment, for example, because the integrated circuit packaging material is polluted by high-radiation elements or the integrated circuit is exposed to cosmic ray radiation environment, the bombardment of a single high-energy particle can cause the sensitive node of the integrated circuit to produce instantaneous logic Error, called Single Event Transient (Single Event Transient, SET for short) pulse. [0003] At present, known integrated circuits for measuring the length of transient pulses of single-event upsets use inverter chains as the co...

Claims

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Application Information

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IPC IPC(8): G01R29/02
CPCG01R29/02
Inventor 张斌王海时
Owner CHENGDU UNIV OF INFORMATION TECH
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