Parameter re-calibration method for structured light three-dimensional measurement system, and equipment

A technology of three-dimensional measurement and calibration method, which is applied in the field of computer vision, can solve the problems of low measurement accuracy and immaturity, achieve the effect of improving the absolute spatial position and relative accuracy, and improving the accuracy of three-dimensional calibration

Active Publication Date: 2017-12-12
SOUTHEAST UNIV
View PDF6 Cites 31 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the calibration of projectors is still immature, and the parameter error of the projector obtained by the above me

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Parameter re-calibration method for structured light three-dimensional measurement system, and equipment
  • Parameter re-calibration method for structured light three-dimensional measurement system, and equipment
  • Parameter re-calibration method for structured light three-dimensional measurement system, and equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The invention relates to a method for recalibrating internal parameters of a projector of a structured light three-dimensional measurement system, which is specifically aimed at a measurement system with one camera and one projector, and improves the calibration accuracy of the system. Specifically, an auxiliary camera is added to the original system, a high-precision white plate (calibration plate) is placed, the projector projects a structured light pattern, and the original system camera and the auxiliary camera collect the white plate pattern. Firstly, the dual cameras are calibrated to obtain the parameters of the auxiliary camera; secondly, the white plate is reconstructed based on the principle of stereo vision by using the photographs taken, and then the reconstructed point cloud is back-projected onto the emitting phase surface of the projector, and the corresponding projection phase is calculated, and compared with The actual phase difference is obtained to obt...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a parameter re-calibration method for a structured light three-dimensional measurement system, and equipment; and an auxiliary camera is added in a system with a camera and a projector to realize re calibration on a parameter inside the projector. A high-precision white flat plate is arranged; the projector projects a structured light pattern; and the original system camera and the auxiliary camera collect a white flat plate pattern. The two cameras are calibrated to obtain the parameter of the auxiliary camera; on the basis of a stereoscopic vision principle, a white flat plate is reconstructed by using a shot picture; a reconstructed point cloud is projected to an emission phase plane of the projector in a back projection mode, a corresponding projection phase is calculated, and a difference between the calculated projection phase and an actual phase to obtain a phase residual difference value; and then on the basis of a principle of least squares, calculation is carried out to obtain error values of a transverse equivalent focal distance and a lateral optical center of the projector, thereby completing re calibration of the parameter inside the projector. Therefore, the calibration accuracy of the structured light three-dimensional measurement system is improved.

Description

technical field [0001] The invention relates to a method and equipment for recalibrating internal parameters of a projector in a structured light three-dimensional measurement system, and belongs to the technical field of computer vision. Background technique [0002] Structured light three-dimensional measurement system is an important three-dimensional measurement system in the field of computer vision, which has the characteristics of fast, easy assembly and high precision. The accuracy of the system parameters directly determines the measurement accuracy of the system. [0003] The parameters of the structured light 3D measurement system are obtained through calibration, and the quality of the calibration method directly determines the accuracy of the obtained system parameters. The current calibration of the system mainly includes two parts, camera calibration and projector calibration. The research on camera calibration has a long history. The classic methods include...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B11/24
CPCG01B11/2433
Inventor 周平于云雷何思渊蔡国超
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap