Defect inspection system, film manufacturing device, and defect inspection method

Abstract

The present invention provides a defect inspection system, a film manufacturing apparatus, and a defect inspection method capable of easily identifying a position of a defect of a film and of identifying a type of the defect more easily, wherein the defect location determination unit of the analysis device of the defect inspection system determines the same location based on the variation calculation unit of the image processing unit of the defect inspection system processed by the image generation unit (16), the integration unit (15) and the image generation unit (16) to determine the position of the defect on the film (2a), and the defect type identification unit The data extraction unit of the processing unit, and the column divided image processed by the data storage unit, and identifies the type of the defect determined by the defect position specifying unit. The column segmentation images make it easy to identify the type of defect. Therefore, the position of the defect can be easily identified and the type of the defect can be more easily identified.

Description

technical field [0001] The present invention relates to a defect inspection system, a film manufacturing device, and a defect inspection method for inspecting defects of a film. Background technique [0002] A defect inspection system is known that detects defects in optical films such as polarizing films and retardation films, laminated films used for battery separators, and the like. Such a defect inspection system transports a film along a transport direction, captures two-dimensional images of the film at discrete times, and performs defect inspection based on the captured two-dimensional images. For example, the system in Patent Document 1 divides a two-dimensional image into a plurality of columns arranged along the conveying direction, and generates columns at the same position in each image of two-dimensional images captured at discrete times in a time-series order. Column split image. The column-segmented image is processed into a defect-enhanced processed image i...

AI Technical Summary

Problems solved by technology

However, in the above-mentioned technology, the defect-enhanced image enhances the brightness variation, so it is difficult to identify the type of defect through the defect-enhanced image, and it is desired to improve

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