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A Timed Censored Reliability Test Method Applicable to Weibull Distribution Products

A technology of Weibull distribution and timing truncation, which is applied in the field of product reliability testing, can solve the problems of conservative results and achieve the effect of improving the evaluation level and improving work efficiency

Inactive Publication Date: 2020-02-07
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At this time, using the test plan of exponential distribution to do reliability appraisal test on products whose failure data obeys Weibull distribution, the result is too conservative

Method used

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  • A Timed Censored Reliability Test Method Applicable to Weibull Distribution Products
  • A Timed Censored Reliability Test Method Applicable to Weibull Distribution Products
  • A Timed Censored Reliability Test Method Applicable to Weibull Distribution Products

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Embodiment Construction

[0065] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0066] Such as figure 1 As shown, the timed censored reliability test method suitable for Weibull distribution products includes the following steps:

[0067] S1. Obtain the shape parameter m of the Weibull distribution according to the historical data; determine the basic parameters of the timed censored test scheme;

[0068] S2, according to the shape parameter m of Weibull distribution and the basic parameter of timing ...

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Abstract

The invention discloses a timing censoring reliability test method suitable for Weibull distribution type products, which comprises the following steps: S1, obtaining the shape parameter m of Weibull distribution according to historical data; determining the basic parameters of the timing censoring test scheme ; S2. Determine the allowable failure number c of the test scheme according to the shape parameter m of the Weibull distribution and the basic parameters of the timing censored test scheme; S3. Determine the total test time T of the test scheme according to the allowable failure number c of the test scheme. The present invention can conduct reliability appraisal on Weibull distribution type products, determine the test plan more scientifically and rationally, greatly improve the product reliability evaluation level, and check the design and batch production of products, thereby improving the quality and reliability of products sex.

Description

technical field [0001] The invention relates to the technical field of product reliability test, in particular to a timing censored reliability test method suitable for Weibull distribution type products. Background technique [0002] Reliability test is a general term for various tests to understand, evaluate, analyze and improve product reliability, aiming at exposing product defects, providing necessary information for improving product reliability and finally verifying product reliability. In other words, any test related to product failure or failure effects can be considered a reliability test. The reliability of the product is designed, manufactured, managed, and tested. The reliability test plays a vital role in the product development process, especially to ensure that the product meets the reliability requirements of the design, especially It is a reliability identification test, which is to verify whether the reliability of the product meets the design requiremen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M99/00
CPCG01M99/00
Inventor 黄洪钟黄鹏李彦锋彭卫文李贺胡钧铭张凯延
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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