Energy parameter adjustment system and method in chip error injection test

A technology of parameter adjustment and error injection, applied in the direction of electronic circuit testing, etc., can solve the problems of inability to guarantee the accuracy and comprehensiveness of test results, different sensitivity of energy sources, and high test cost, so as to improve the level of test automation and avoid damage , The effect of reducing the cost of testing

Active Publication Date: 2017-12-22
北京银联金卡科技有限公司
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Problems solved by technology

[0006] At present, the problem encountered in the testing of chip fault injection attacks is that due to the different chip technology and circuit structure, the sensitivity of different chips or different modules of the same chip to energy sources (laser, electromagnetic, glitch, etc.) Different, for example, when the laser energy is to

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  • Energy parameter adjustment system and method in chip error injection test
  • Energy parameter adjustment system and method in chip error injection test
  • Energy parameter adjustment system and method in chip error injection test

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Embodiment Construction

[0049] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0050] Such as figure 1 As shown, the energy parameter adjustment system in the chip error injection test disclosed by the present invention includes: a host computer, a chip to be tested, an electromagnetic acquisition module, a power consumption acquisition module, an energy parameter analysis module, an energy parameter control module, and an interference source.

[0051] The interference source is used to output energy and perform error injection attack testing on the chip under test; the interference source includes lasers, electromagnetic jammers, glitch generators, etc.

[0052]The host computer performs data connection with the chip to be tested through a communication module (a module that can establish a data connection with the chip, such as a module that follows communication protocols such as 7816, 14443, SWP, UART, USB, etc.), an...

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Abstract

The invention discloses an energy parameter adjustment system and method in a chip error injection test, and the method comprises the steps: collecting a state signal, electromagnetic signal and power consumption signal of a to-be-tested chip in an error injection attack test process; judging and analyzing whether the injected energy is reasonable or not according to the state signal, the electromagnetic signal and the power consumption signal; dynamically adjusting the energy parameters of an interference source according to an analysis result, and controlling the output energy of the interference source according to the adjusted energy parameters; generating more reasonable energy parameter information in advance through the former test and adjustment process, carrying out the testing operation later according to the energy parameter information, and updating and optimizing the pre-generated energy parameter information in the test process. The system and method can achieve the automatic adjustment and optimization of parameters, greatly improve the testing efficiency, and guarantee the accuracy and effectiveness of a testing result.

Description

technical field [0001] The invention belongs to the technical field of chip information security, and relates to an energy parameter adjustment system and method in chip error injection testing. Background technique [0002] The chip stores key information such as user personal information and account information. Once it is attacked and used by criminals, the information in the chip will be leaked, such as personal information leakage, user name and password leakage, property loss, etc., causing irreparable damage to users. Loss. [0003] The applicant Beijing UnionPay Gold Card Technology Co., Ltd. is committed to researching chip information security technology, testing the security of chips through various testing methods, providing timely and reliable defense tips for chip research and development, and providing safe and effective chips for major banks . In order to ensure the safety of the chip and prevent criminals from proposing targeted and further attack methods ...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 张城李秘张永峰马哲孙衍琪渠韶光张炼孟飞宇张志波杨子砚鲍岩
Owner 北京银联金卡科技有限公司
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