A vacuum interrupter aging device based on multi-power synthesis

Abstract

The invention discloses a multi-power-supply synthesis-based vacuum arc-extinguishing chamber conditioning apparatus. The voltage output end of a low-voltage direct current source is connected with acollector of an IGBT chip; the grounding end of a high-voltage pulse source and the grounding end of a high-voltage direct current source are both connected with one end of the vacuum arc-extinguishing chamber while the other end of the vacuum arc-extinguishing chamber is connected with the high-voltage end of the high-voltage direct current source, the high-voltage end of the high-voltage pulse source and the emitter of the IGBT chip; the output end of a current detection unit and the output end of a voltage detection unit are both connected with the input end of a signal detection and IGBT trigger control unit separately; and the output end of the signal detection and IGBT trigger control unit is connected with the gate pole of the IGBT chip. By virtue of the multi-power-supply synthesis-based vacuum arc-extinguishing chamber conditioning apparatus, breakdown and conditioning of the vacuum arc-extinguishing chamber can be realized; and in addition, relatively low requirement on the power supply and relatively complete conditioning are realized in the breakdown process.

Description

technical field [0001] The invention belongs to the technical field of vacuum interrupter aging, and relates to a vacuum interrupter aging device based on multi-power synthesis. Background technique [0002] As an important link in the production process of vacuum interrupters, aging has been widely used in the field of electric vacuum, mainly including current aging, voltage spark aging, and pulse aging technologies. The results of research and practice in recent years show that the existing aging technology has the following problems: [0003] Current aging can remove the gas, oxide, micro-protrusion and other insulation weaknesses on the electrode surface, which is beneficial to suppress the breakdown of the vacuum gap after the arc, thereby improving the high-current breaking capacity of the vacuum interrupter. However, in practical applications, DC Current aging will cause the surface of the contact to burn partially, resulting in insufficient aging of the surface area...

AI Technical Summary

Problems solved by technology

However, whether it is the traditional voltage burn-in technology or the improved voltage burn-in technology with capacitors and inductors connected in series at both ends of the vacuum interrupter, there is a large randomness in the single discharge energy and discharge frequency. It is difficult to effectively control the degree of refining, aging trend and consistency

[0005] Literature (Milun. Development of Pulse Aging Bench for Vacuum High Voltage Components[J]. Vacuum, 2006, 43(4): P23-25) and Document (Milun, Liu Tie, Zhang Peng. Program-controlled Vacuum High Voltage Device Aging Bench [J]. Information and Electronic Engineering, 2007, 5 (2): 154-157) proposed a pulse aging method for high-voltage vacuum devices, because the device uses a single main power supply to provide breakdown voltage and aging Therefore, when designing the pulse power supply, it is necessary to take into account the insulation and power requirements of the host power supply at the same time. The cost and technical difficulty are relatively high. In addition, when the output circuit of the pulse power The existence of the gap capacitance effect will affect the peak value of the pulse voltage, and its adjustment method has great technical limitations

[0006] For pulse aging technology, according to literature (Xiaoshe Zhai, Wei Zhang, Xiaofei Yao, Distribution of High-Voltage and High Frequency Impulse Breakdown Sparks inConitioned Contact Surface[C], in proceedings of the 27th ISDEIV, Suzhou, China, pp 33- 36.2016.Sep), based on the breakdown and aging of narrow pulses, since the single breakdown energy is limited and controllable, the aging process of contacts is suppressed, that is, each pulse breakdown It can always be located at the weak point area of ​​the insulation on the surface of the contact, avoiding the local concentration of the breakdown process on the surface of the contact, thus ensuring the uniformity of aging, but due to the limitation of the energy of a single discharge, there is aging on the surface of the contact Insufficient smelting depth and aging durability

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