Instrument panel assembly quality mass center measurement system and measurement method
A measurement system and instrument panel technology, which is applied in the field of instrument panel assembly center of mass measurement systems, and can solve problems such as poor measurement accuracy and difficulty in measurement.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
specific Embodiment approach
[0076] In order to further illustrate the technical solution of the present invention, in conjunction with the accompanying drawings, the specific implementation of the present invention is as follows:
[0077] The invention discloses a system for measuring the center of mass of an instrument panel assembly. The measuring system is composed of a measuring device and a data acquisition control assembly. The measuring device consists of several groups such as Figure 6 The measurement units shown are combined, and the measurement device can be composed of three sets of measurement units, such as Figure 7 shown; the measuring device can also be composed of four groups of measuring units, such as image 3 shown. In this embodiment, the measuring device is composed of four groups of measuring units, and the specific structure is as follows:
[0078] Such as image 3 As shown, the measuring device is composed of four groups of measuring units, and the structure of each group of...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com