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Single x-ray differential phase contrast image detection system

A technology of image detection and differential phase contrast, which is applied in the direction of material analysis using radiation, material analysis using wave/particle radiation, and measuring devices, which can solve the problem of increasing the absorption of X-ray dose, increasing the imaging time of objects, unfavorable applications, etc. question

Active Publication Date: 2020-10-27
SHENZHEN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Every time the phase grating or analysis grating is moved, the object needs to be exposed once, and multiple movements mean that the object needs to be exposed multiple times, which will increase the absorption of X-ray dose by the object and increase the imaging time of the object, which is not conducive to the application of this technology in medicine and Applications in Biology
At the same time, the movement of the grating is at the sub-micron level, and the system requires sub-micron displacement equipment. Expensive displacement equipment will undoubtedly increase the complexity and cost of the imaging system

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  • Single x-ray differential phase contrast image detection system

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Embodiment 1

[0049] Embodiment 1, as Figure 8 What is shown is the first implementation mode. In this embodiment, a conversion screen with a specific structure is used to restore the phase information of the object along the periodic direction (row direction) of the X-ray interference fringes.

[0050] The following is a detailed description of a 4-step phase shift:

[0051] According to the X-ray interference fringe formula:

[0052] (1)

[0053] at this time ,( ), corresponding , the phase information can be solved as (2)

[0054] The displacement of the X-ray interference fringe movement is 1 / 4 cycle each time the fringe is moved.

[0055] It is set that the absorption and phase information of objects within the range of the above four visible light pixel units have little or no change. The fringe is detected using a pixelated transition screen, such as Figure 8 The detection system shown includes X-ray interference fringes 1 , pixelated conversion screen 2 , visible ...

Embodiment 2

[0060] Example 2, such as Figure 9 As shown, in this embodiment, the pixel conversion screen with a special structure is used to recover the phase information of the object in the direction perpendicular to the period of the X-ray interference fringes.

[0061] Take a 4-step phase shift as an example. Along the X-ray propagation direction, the X-ray interference fringes 1 of the imaging system, the spatial positions of the pixel conversion screen and the visible light detector are as follows: figure 2 As shown, the detailed relative position and size relationship are as follows Figure 9 shown. The direction of the X-ray interference fringe 1 is the row direction shown in the figure, and the phase information of the object is restored by using 4 pixel units (9-2) perpendicular to this direction, and the numbers of the 4 pixel units 21 are 1, 2, 3 respectively , 4. The width p of a single pixel unit of the pixel conversion screen is the same as the period p of the X-ray i...

Embodiment 3

[0063] Embodiment 3 is the third embodiment. In this embodiment, an absorption grating with a special structure is used to detect X-ray interference fringes.

[0064] like Figure 10 As shown, taking four visible light pixel units to restore the phase information of an object as an example, the specific structure of the absorption grating is explained in detail:

[0065] like Figure 10 As shown, from top to bottom are X-ray interference fringes 5 , absorption grating 6 , conversion screen 7 and visible light pixel unit 8 . The X-ray interference fringe period of the imaging system is p, and the period length of the absorption grating unit is the same as the X-ray interference fringe period p.

[0066] The periodic unit 61 of the absorption grating 6 includes a light-transmitting region 611 and an absorbing region 612. The single pixel of the positive visible light detector is a square, the side length is T, and the relationship with the length p of the periodic unit 61 of ...

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Abstract

The invention discloses a single X-ray differential contrast image acquisition system. An X-ray conversion screen, a coupling device and a visible light detector are arranged in sequence along the X-ray propagation direction. The X-ray conversion screen refers to a pixelation conversion screen, and the arrangement of pixel units is matched with the period of the X-ray interference fringe of an imaging system. Or, an absorption grating, the X-ray conversion screen and the visible light detector are arranged in sequence along the X-ray propagation direction, a plurality of periodic units are arranged along the lines and the rows to form the absorption grating, the periodic units are rectangular, and the width of the periodic units is equal to that of the period of the X-ray interference fringe of the imaging system. Frequent exposure of objects and shifting of the phase grating are avoided, phase acquisition process of X-ray differential contrast imaging is simplified, X-ray differentialcontrast imaging can be carried out within a short time, and thus, imaging efficiency is improved.

Description

technical field [0001] The invention relates to the fields of medicine and non-destructive flaw detection, and relates to an X-ray differential phase contrast imaging system, in particular to a single X-ray differential phase contrast image detection system. Background technique [0002] Ordinary X-ray imaging uses the attenuation of X-rays by objects to form image contrast, but for weakly absorbing objects, if different parts have the same composition and the same attenuation to X-rays, they cannot form outstanding contrast, such as biological soft tissues, but nearly ten In recent years, X-ray phase contrast imaging can image weakly absorbing objects, and has attracted extensive attention from many researchers at home and abroad. [0003] At present, there are many methods to realize X-ray phase contrast imaging, such as coaxial phase contrast using micro-focus spot light source, diffraction enhancement using synchrotron radiation light source, double-beam interference ima...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/041G01N23/18G01N23/083
Inventor 刘鑫王翔黄建衡雷耀虎郭金川李冀
Owner SHENZHEN UNIV
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