A method for generating sram type fpga anti-radiation hardening file

Abstract

The invention provides a method for generating an anti-radiation hardening file of an SRAM type FPGA. An upper computer selects models and a quantity of target FPGA devices needed to be hardened and obtains configuration bit stream files of the target FPGA devices; a type and a model of an external memory used for storing the configuration bit stream files are configured; a check mode is set, andthe FPGA configuration bit stream files are assembled in a storage file in a set data format according to the check mode; according to the type and the model of the external memory, the storage capacity of each storage block of the external memory is determined, the storage file is split according to the storage capacity of each storage block, and formed split files are stored in the storage block; and a programming file of the external memory is generated according to each split file. The method for generating anti-radiation hardening files for the target FPGA devices is realized, so that effective configuration, error detection, error correction and refreshing of target FPGAs can be ensured, and the reliability of the SRAM type FPGA can be effectively improved.

Description

technical field [0001] The invention relates to the field of anti-radiation hardening technology, in particular to a method for generating a SRAM-type FPGA anti-radiation hardening file. Background technique [0002] With the shrinking of CMOS process size, integrated circuits working in space environment are more and more seriously affected by failure problems caused by single event errors. Future data relay satellites, broadband communication satellites, remote sensing satellites, radio reconnaissance satellites, navigation satellites, and early warning satellites all need powerful on-board processing platforms (OPP, On-board Processing Platforms) to ensure space support capabilities. These on-board processing The platform is mainly built with FPGA, DSP, ADC, DAC and other chips as the main components. And these large-scale integrated circuit devices, especially SRAM-FPGA are very susceptible to the influence of spatial single event effect. The existence of single event ...

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Problems solved by technology

[0004] Although the above-mentioned prior art discloses that the configuration of the external memory is used to realize the hardening of the target FPGA, it does not provide how to generate the hardening file in the external memory, nor does it specify the data format of the hardening file

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