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A fast labeling method of mbd model array features for digital inspection

An array and model technology, applied in the field of digital inspection, can solve problems such as low efficiency, information omission, fallacy, etc., and achieve the effect of automatic execution, efficiency and accuracy

Active Publication Date: 2020-09-11
SHENYANG AEROSPACE UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The method of manual intervention is not only inefficient, but also has the risk of information omission or even error caused by energy slack or understanding deviation

Method used

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  • A fast labeling method of mbd model array features for digital inspection
  • A fast labeling method of mbd model array features for digital inspection
  • A fast labeling method of mbd model array features for digital inspection

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Embodiment Construction

[0040] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0041] This embodiment uses the MBD model array feature rapid labeling method for digital detection, such as figure 1 The MBD model to be tested is shown for rapid labeling of model array features.

[0042] A fast labeling method for digital detection-oriented MBD model array features, such as figure 2 shown, including the following steps:

[0043] Step 1: Uniformly sample a set of array features from the MBD model to obtain a sampling point cloud that can characterize the shape of each array feature member. The specific method is:

[0044] Step 1.1: Analyze the MBD model according to the existing annotation results of the array feature, identify all the members on the...

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Abstract

The invention provides a digital detection-oriented MBD model array feature rapid labeling method, which relates to the technical field of digital detection. This method first uniformly samples a group of array features on the MBD model to obtain the sampling point cloud; then uses the PCA algorithm and the improved ICP algorithm to perform coarse registration and precise registration between the sampling point clouds, and establishes the relationship between the sampling point clouds. Matching relationship; finally, according to the corresponding relationship between the sampled point clouds, complete the missing labeling information of the array features. The digital detection-oriented MBD model array feature rapid labeling method provided by the present invention automatically completes the missing information on the basis of not interfering with the designer's habit of marking the MBD model's array feature, and improves the efficiency of array feature dimension labeling and accuracy, so that the array feature objects marked by the rapid labeling method meet the requirements of measurability, and realize the one-to-one correspondence between the objects to be inspected and the inspection requirements.

Description

technical field [0001] The invention relates to the technical field of digital detection, in particular to a method for quickly labeling MBD model array features oriented to digital detection. Background technique [0002] With the widespread use of Model Based Definition (MBD) technology in the field of product R&D and manufacturing, the digital inspection model based on the MBD model has become a hot spot in academia and industry. The MBD model is used as the only detection basis in the product inspection process and is directly transmitted to the detection equipment, which effectively guarantees the simplification of data sources in the inspection process, and also realizes the rapid transmission and closed-loop management of product data between design, manufacturing and inspection. , which can effectively improve the quality of product development and shorten the development cycle. [0003] In order to ensure the accuracy and completeness of inspection information tran...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/62
CPCG06V10/751
Inventor 屈力刚李亮万景洋张杰卫青廷丁来军张丹雅李静
Owner SHENYANG AEROSPACE UNIVERSITY
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