Soc (System-on-Chip) chip verification method

A verification method and chip technology, applied in the direction of program control design, instruments, electrical digital data processing, etc., can solve the problems of low efficiency of positioning problems, no seed generation mechanism, no debugging means, etc., to achieve the effect of interaction

Active Publication Date: 2018-03-13
RAMAXEL TECH SHENZHEN
View PDF8 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Take the CPU program implemented in C language as an example. If the rand function is directly called in the C program to be random, since the rand function depends on the randomness of the seed, and the embedded CPU does not provide an effective seed generation mechanism, this will cause The data is fixed, that is, the SoC simulation runs a fixed test case every time, so the coverage cannot be improved.
Similarly, if an external program is used to generate random numbers and the C program include method, there is a disadvantage that the test case fails to run and the scenario cannot be reproduced
In addition, neither verification platform provides a good means of debugging, which greatly reduces the efficiency of locating problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Soc (System-on-Chip) chip verification method
  • Soc (System-on-Chip) chip verification method
  • Soc (System-on-Chip) chip verification method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0015] image 3 It is a schematic diagram of the new Soc verification platform. The main difference between the traditional program-generated random number Soc verification platform and the script-generated random number Soc verification platform is that the dynamic randomization of CPU program incentives can be realized through the virtual communication interface, and the constraints of the incentives can be finer. At the same time, virtual communication can be mo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an Soc (System-on-Chip) chip verification method. The method is characterized in that one or more that two bus address space segments are obtained by dividing in address spaceinside a to-be-verified Soc chip to use the same as a virtual communication interface, and a virtual interface including an external driving module and a monitoring module is also mounted outside theto-be-verified Soc chip; random-number application is monitored by the monitoring module, random data are generated through a random function, and the generated random data are written into a virtualstorage carrier through the external driving module; and different addresses are defined as different communication requests in an address range of the virtual communication interface, and whether a communication request belongs to the pre-planned communication requests is recognized by the virtual interface through address information of data on a bus. Generation of random excitation is effectively controlled through introducing real-time monitoring of the virtual communication interface, real-time interaction between a CPU program and a hardware simulation program is realized through information printing and simulation process control, quick locating of a problem is facilitated, and verification is enabled to quickly converge.

Description

technical field [0001] The invention relates to the field of Soc chip design and manufacture, in particular to a Soc chip verification method. Background technique [0002] With the continuous development of design and process technology, the scale of integrated circuit design is getting bigger and bigger, and the complexity is getting higher and higher. In order to shorten the time to market of chips and save development costs, the integration of multiple IPs has gradually become the mainstream, that is, SoC (System-on-Chip) technology is becoming more and more mature, but it also brings about an exponential increase in the complexity of SoC verification. Therefore, it is particularly important to have an efficient verification platform to quickly converge the verification. The convergence of verification is closely related to the effectiveness of incentive generation and the convenience of debugging, and CPUs are usually embedded in SoC chips, and the randomness of CPU pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/455
CPCG06F9/45504
Inventor 杨崇朋陈明园周秀梅范宏亮陈政睿
Owner RAMAXEL TECH SHENZHEN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products