Display device and testing method thereof
A technology of a display device and a test method, which is applied in the direction of measuring devices, single semiconductor device testing, semiconductor working life testing, etc., and can solve problems such as driving defects, defects that cannot be detected with the naked eye, and lighting test defects
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[0038] The advantages and features of the present invention and methods of achieving them will be further clarified by the following embodiments described with reference to the accompanying drawings. This invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will convey the concept of the invention to those skilled in the art. Furthermore, the present invention is limited only by the scope of the claims.
[0039] The shapes, dimensions, proportions, angles and numbers disclosed in the drawings for describing the embodiments of the present invention are examples only, and thus the present invention is not limited to the shown details. Throughout this specification, the same reference numerals refer to the same elements. In the following description, when it is determined that a detailed description of a ...
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