System, method and device for testing smart cards, and computer readable storage medium

A test system and test method technology, applied in the field of smart cards, can solve the problems of wasting labor force, increasing project time, resources, personnel costs, and long test cycle, so as to reduce test cycle time, reduce project cost, and improve project efficiency Effect

Inactive Publication Date: 2018-03-20
EASTCOMPEACE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above two methods have one thing in common, which is that the smart card must be tested by manually understanding the test tool or manual test script configuration. However, manual manual operation for a long time will not only lead to a long test cycle, but also waste labor and reduce project development efficiency. , but also increased the project time, resources, personnel costs

Method used

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  • System, method and device for testing smart cards, and computer readable storage medium
  • System, method and device for testing smart cards, and computer readable storage medium

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Embodiment Construction

[0033] The core of the present invention is to provide a test system for smart cards, which automatically replaces manual operations, reduces the test cycle time, improves project efficiency, and reduces project costs; another core of the present invention is to provide a test system and equipment for smart cards and computer readable storage media.

[0034] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present inv...

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PUM

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Abstract

The invention discloses a system for testing smart cards. The system includes a recording module, an execution module, a judging module, and a time delay module. The recording module is used for recording a function test script for smart cards in advance. The execution module is used for executing the function test script on smart cards under test. The judging module is used for judging whether the execution of the function test script is completed. If the execution of the function test script is completed, the judging module triggers the execution module to execute the function test script onnext smart card under test until the execution module executes the function test script on all smart cards under test. If the execution of the function test script is not completed, the judging module triggers the time delay module. The time delay module is used for extending the time for the execution module to execute the function test script on the current smart card under test so that the execution module can continue to execute the function test script on the current smart card under test. Automatic test replaces manual test, the test period time is reduced, the efficiency of projects isimproved, and the cost of projects is reduced. The invention further discloses a method and a device for testing smart cards and a computer readable storage medium, which have the same beneficial effect.

Description

technical field [0001] The invention relates to the field of smart cards, in particular to a smart card testing system, method, equipment and computer-readable storage medium. Background technique [0002] During the development of smart cards, testing is essential in engineering projects. At present, the smart card function test is mainly divided into self-developed test script and purchased third-party test tool test. The above two methods have one thing in common, which is that the smart card must be tested through manual understanding of test tools or manual test script configuration. However, manual manual operations for a long time will not only lead to a long test cycle, but also waste labor and reduce project development efficiency. , but also increased the time, resources, and personnel costs of the project. [0003] Therefore, how to provide a solution to the above technical problems is a problem that those skilled in the art need to solve at present. Contents ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G06F11/36
CPCG01R31/2834G06F11/3672
Inventor 刘瀚仁刘攀徐圣
Owner EASTCOMPEACE TECH
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