AOI (Automated Optical Inspection)-based panel detecting judging method and device

A panel inspection and panel-to-panel technology, which is applied in the directions of measuring devices, optical testing flaws/defects, image data processing, etc., can solve the problems of labor cost, reduced work efficiency, and low luminous intensity, so as to reduce production sites and improve The detection rate and the effect of reducing false detection

Active Publication Date: 2018-03-27
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology

[0007] 1. For large-size LCD panels, due to the large area, the LCD panel and the camera cannot be accurately parallel
Therefore, there are also differences in the focusing effect of different positions, resulting in defects of the same area showing different sizes on the camera.
[0008] 2. There is a problem of strength and weakness of the defect. The bright spot area of ​​the L0 screen may be small, but the luminous intensity is very large, and the halo is very serious, resulting in a large imaging area on the camera
At the same time, the bright spots of some L0 images may have a large area, but the luminous intensity is very small, resultin

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  • AOI (Automated Optical Inspection)-based panel detecting judging method and device

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[0035] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments to facilitate a clear understanding of the present invention, but they do not limit the present invention.

[0036] Such as Figure 1-4 As shown, the AOI-based panel detection method of the present invention includes the following steps:

[0037] Step 1. Perform the initial defect inspection on the panel to be tested through the existing inspection organization to determine different types of main defects;

[0038] There are many types of defects in LCD / OLED panels, and there are some differences in the performance of different types of defects. From the large frame, it can be divided into point defects, line defects and / or mura defects. When performing defect detection, design different patterns for different defects, and then perform image shooting under the corresponding Pattern, and perform defect detection on the captured images, that is...

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Abstract

The invention discloses an AOI (Automated Optical Inspection)-based panel detecting judging method and an AOI-based panel detecting judging device. The method comprises the following processes: performing primary defect detection on a panel to determine different types of main defects; performing surface dust filtering on all detected defects; respectively performing disaggregated classification on various types of the main defects in sequence to form various sub-defects according to a defect classification standard; re-judging various sub-defects by adopting a re-judging mechanism, and comparing a re-judging result with a defect level to obtain disaggregated classification of defect levels. According to the AOI-based panel detecting judging method and the AOI-based panel detecting judgingdevice, after the defects are detected primarily, the defects are judged secondarily through the re-judging mechanism, so that accurate and detailed level judgement output can be performed on the defects of the panel; manpower cost is greatly reduced; detection rate is improved.

Description

technical field [0001] The invention belongs to the technical field of panel automatic defect detection, and in particular relates to an AOI-based panel detection and judgment method and device. Background technique [0002] With the development of the LCD panel inspection industry, manufacturers have higher and higher requirements for panel inspection, and have different degraded specifications for different types of defects. In order to correctly degrade the output of the panel, the AOI equipment needs to accurately classify the detected defects, and degrade the classified defects according to the customer's requirements. [0003] For example, for dark spot defects, a single dark spot (0.5-1.5) is judged as an OK level, two consecutive dark spots (1.5-2.5) is judged as an L level, three consecutive dark spots (2.5-3.5) is judged as a K level, and multiple dark spots (2.5-3.5) are judged as a K level. Dark (>3.5) is judged as C level. However, how to distinguish double...

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Application Information

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IPC IPC(8): G01N21/88G01N21/95G01N21/94G06T7/00
CPCG01N21/8806G01N21/8851G01N21/94G01N21/95G01N2021/8867G01N2021/8874G01N2021/8887G01N2021/9513G06T7/0004
Inventor 邓标华张胜森
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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