A Statistical Method for Preprocessing Circuit Noise of Infrared TDI Detector

Abstract

The invention discloses a statistical system for the noise of an infrared TDI detector preprocessing circuit, which includes: an infrared TDI detector assembly, a preprocessing circuit, and a host computer; the infrared TDI detector assembly is used to complete photoelectric conversion and imaging signal output ; The preprocessing circuit is connected to the infrared TDI detector assembly for receiving, conditioning, and analog-to-digital conversion of imaging signals, and at the same time, provides power and timing drive signals for the infrared TDI detector assembly, and collects and processes digital The final imaging data is transmitted to the host computer; the host computer is used for image data collection and processing. The statistical result of the invention has strong practicability, high operability, short development cycle and high test coverage.

Description

technical field [0001] The invention belongs to the technical field of photoelectric detection, and relates to a statistical method for preprocessing circuit noise of an infrared TDI detector. Background technique [0002] Noise characteristics are one of the important characteristics of optoelectronic systems. Noise level is the decisive factor limiting the performance of optoelectronic systems. As the core component of scanning imaging optoelectronic systems, infrared TDI detectors have always been an important indicator of detector performance assessment. It is an indicator that device manufacturers and users focus on. Moreover, scanning imaging is different from staring imaging. In order to match a specific scanning speed, the integration time of the detector is often fixed. The accumulation of radiant energy is limited by the working mode. The signal-to-noise ratio It is becoming more and more important in this type of imaging system. At present, the manufacturer's tes...

AI Technical Summary

Problems solved by technology

At present, the manufacturer's test method for the noise index of the detector itself is relatively complete. However, in the photoelectric imaging system based on the infrared TDI detector, the noise measurement method for the peripheral circuit of the detector is not perfect. The preprocessing circuit is the peripheral circuit of the detector. One, the preprocessing circuit is often used for the conditioning of the detector output signal, the conversion of the analog signal to the digital signal, and the acquisition and processing of the digital signal. One of the factors of the noise ratio, it is worth noting that the preprocessing circuit is generally an analog-digital hybrid circuit. If the design is not proper, the introduction of digital noise will have a huge impact on the image quality. Therefore, it is very necessary to propose a preprocessing circuit itself. Statistical method of noise, to evaluate the noise level of the preprocessing circuit, as the basis for the optimal design of the preprocessing circuit, so as to finally guarantee the signal-to-noise ratio of the photoelectric imaging system based on the infrared TDI detector

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