Test method for components of spacecraft

A test method and technology of components, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve problems such as the inability to effectively simulate the working state, and achieve the effect of eliminating early failures and accurate test results.

Inactive Publication Date: 2018-04-13
BEIJING SPACE TECH RES & TEST CENT
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  • Abstract
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Problems solved by technology

However, in the current spacecraft appraisal method, the pressurization appraisal item is not included, and the working state of the spacecraft components cannot be effectively simulated when the external pressure is higher than the internal pressure.

Method used

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  • Test method for components of spacecraft
  • Test method for components of spacecraft

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Embodiment Construction

[0021] The description of the embodiments in this specification should be combined with the corresponding drawings, and the drawings should be regarded as a part of the complete specification. In the drawings, the shapes or thicknesses of the embodiments may be exaggerated and marked for simplification or convenience. Furthermore, the parts of each structure in the drawings will be described separately. It should be noted that the elements that are not shown in the drawings or described in words are forms known to those of ordinary skill in the art .

[0022] The descriptions of the embodiments here, any references to directions and orientations are just for convenience of description, and should not be construed as any limitation to the protection scope of the present invention. The following descriptions of the preferred embodiments involve combinations of features, which may exist independently or in combination, and the present invention is not particularly limited to the...

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Abstract

The invention relates to a test method for components of a spacecraft. The method comprises the following steps: a, placing a spacecraft component in a sealed container, and electrically connecting the spacecraft component with a testing device outside the sealed container through a testing cable; b, pressurizing the sealed container to have the pressure be larger than the internal pressure of thespacecraft component, and continuously maintaining the pressure environment in the sealed container; c, reducing the pressure of the sealed container, then carrying out secondary pressurization untilthe pressure is larger than the internal pressure of the spacecraft component, and continuously maintaining the pressure environment in the sealed container; d, continuously circulating the steps b-c, performing the monitoring of the whole spacecraft component in the whole process by means of the testing device, and completing the test after the monitoring result is obtained. The test method of the spacecraft component can effectively simulate the working state when the external pressure of the spacecraft component is higher than the internal pressure of the spacecraft component, and the testresult is accurate, credible and effective.

Description

technical field [0001] The invention relates to a testing method for the components of the spacecraft, in particular to a pressurized testing method for the components of the spacecraft. Background technique [0002] The special mission of the aerospace system or equipment, the working space environment, etc., require the aerospace components used to have the characteristics of small size, light weight, low power consumption, high reliability level, and strong resistance to space radiation. Aerospace components must go through strict appraisal and even batch-by-batch sampling before they can be used by users. [0003] "Microelectronic Device Test Methods and Procedures" (GJB 548B-2005) stipulates three major verification items of component environmental test, mechanical test and electrical test, including low pressure (working at high altitude), leak detection, thermal shock, temperature cycle Test and other test items. Most aerospace components are sealed and packaged in ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 雷剑宇李光日霍佳婧王冉于磊张振华
Owner BEIJING SPACE TECH RES & TEST CENT
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