Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for safety assessment of anti-fault injection attack of integrated circuit based on information entropy

An integrated circuit and fault injection technology, applied in secure communication devices, countermeasures against encryption mechanisms, electrical components, etc., can solve the problems of long evaluation time, hidden security risks and high cost of cryptographic chips, and achieve the effect of avoiding excessive protection.

Active Publication Date: 2018-04-20
TIANJIN UNIV
View PDF3 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the key is cracked, it is considered that the cryptographic chip has a security risk and cannot resist fault injection attacks; otherwise, it is considered safe
This evaluation method has two limitations: the first is that the evaluation method has two limitations: the first is that the evaluation results are only safe and unsafe, and it is impossible to grade and quantify safety
The second is that the evaluation scheme needs to use a variety of key analysis methods to crack the key, so as to make a relatively comprehensive evaluation of circuit security, the evaluation time is long and the cost is high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for safety assessment of anti-fault injection attack of integrated circuit based on information entropy
  • Method for safety assessment of anti-fault injection attack of integrated circuit based on information entropy

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The present invention will be further described below in conjunction with the accompanying drawings.

[0018] Such as figure 1 , an integrated circuit anti-fault injection attack security assessment method based on information entropy. Through fault injection, the information leaked by the circuit under the fault model is calculated, and the amount of leaked information is used as an evaluation index to evaluate the security of the integrated circuit. Specifically include the following steps:

[0019] 1. Determine the cryptographic circuit to be tested and the required failure model.

[0020] 2. According to the circuit to be tested and the fault model, calculate how much information the fault model will cause the circuit to leak under theoretical conditions.

[0021] The amount of theoretical information leakage is calculated by formula (1):

[0022] m=n-log|χ| (1)

[0023] Among them, n represents the number of key bits of the circuit under test, χ represents the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for safety assessment of an anti-fault injection attack of an integrated circuit based on information entropy. The method utilizes the information entropy to representthe amount of information which is leaked under fault injection as a quantitative index of safety assessment of the circuit. The method comprises the following steps of (1) determining a to-be-testedpassword circuit and specifying a fault model; (2) computing the theoretical information leakage amount of the fault model on the circuit according to the to-be-tested circuit and the fault model; (4) generating a fault value conforming to the fault model; (4) injecting a generated fault value into the to-be-tested circuit to obtain an error output under a fault condition; (5) computing the actually-measured information leakage amount obtained by the actual fault injection according to the fault value of actual injection and the error output under the fault condition; and (6) obtaining a safety coefficient r by computation according to the theoretical information leakage amount obtained in the step (2) and the actually-measured information leakage amount obtained in the step (5), comparing the r with a preset safety assessment level to obtain safety level assessment of the circuit.

Description

technical field [0001] The present invention relates to the direction of hardware security, and mainly relates to the field of security evaluation of integrated circuits, in particular to an integrated circuit anti-fault injection attack security evaluation method based on information entropy. Background technique [0002] Fault injection is an attack method that seriously threatens the security of cryptographic chips. The basic principle is to inject faults into the security weak parts of the chip to cause abnormal function of the chip, test its functions and parameters when the chip is in an abnormal working state, analyze and compare with the normal working state, and obtain important information inside the chip . Therefore, it is particularly important to find the design loopholes of integrated circuits, take anti-fault injection attack protection measures, and ensure the confidentiality and integrity of information in the system in the use environment. [0003] The ba...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/24H04L9/00
CPCH04L9/004H04L41/145
Inventor 邓鹏杰刘强
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products