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Dielectric constant extracting method based on coplanar waveguide transmission line and terminal equipment

A technology of permittivity and extraction method, which is used in the measurement of dielectric properties, measurement of electrical variables, measurement of resistance/reactance/impedance, etc., and can solve problems such as inability to sweep frequency measurement

Inactive Publication Date: 2018-05-04
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In view of this, the embodiment of the present invention provides a dielectric constant extraction method and terminal equipment based on a coplanar waveguide transmission line to solve the problem that a wider range of frequency sweep measurements cannot be performed in the prior art

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  • Dielectric constant extracting method based on coplanar waveguide transmission line and terminal equipment
  • Dielectric constant extracting method based on coplanar waveguide transmission line and terminal equipment
  • Dielectric constant extracting method based on coplanar waveguide transmission line and terminal equipment

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Embodiment 1

[0160] figure 2 The implementation flow of the method for extracting the dielectric constant based on the coplanar waveguide transmission line provided by Embodiment 1 of the present invention is shown, and the details are as follows:

[0161] In step S101, a certain volume and shape of the sample to be tested is used as the substrate, and multiple redundant transmission lines are designed on it as the TRL calibration standard of the on-chip vector network analyzer. The calibration standard covers the frequency range of the dielectric constant of the sample to be tested , and the error in the TRL calibration process is analyzed, and an error analysis model for solving the propagation constant is established.

[0162] In this step, the process of analyzing the error in the TRL calibration process and establishing an error analysis model for solving the propagation constant is:

[0163] The concatenated transfer matrix M of the i-th calibration piece measured by Yaneti i for ...

Embodiment 2

[0249] Corresponding to the dielectric constant extraction method based on the coplanar waveguide transmission line described in the above embodiment, Figure 5 A schematic diagram of the operating environment of the dielectric constant extraction program provided by the embodiment of the present invention is shown. For ease of description, only the parts related to this embodiment are shown.

[0250] In this embodiment, the dielectric constant extraction program 500 is installed and run in the terminal device 50 . The terminal device 50 may include, but not limited to, a memory 501 and a processor 502 . Figure 5 Only terminal device 50 is shown with components 501-502, but it is to be understood that implementation of all of the illustrated components is not required and that more or fewer components may instead be implemented.

[0251] The storage 501 may be an internal storage unit of the terminal device 50 in some embodiments, for example, a hard disk or a memory of the...

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Abstract

The invention provides a dielectric constant extracting method based on a coplanar waveguide transmission line and terminal equipment. The method comprises the following steps: designing a plurality of redundant transmission lines as a standard to cover a to-be-detected sample dielectric constant frequency range, analyzing errors in a TRL calibration process, and establishing an error analyzing model of a solving transmission constant; selecting common lines according to an effective phase transfer rule, forming line pairs by using the obtained common transmission lines and other transmissionlines to repeatedly and independently measure the various line pairs, and acquiring observation values of a plurality of transmission constants according to the error analyzing model; and determiningunit length resistance and unit length inductance of the transmission lines according to the observation values of the various transmission constants to finally obtain substrate dielectric constants of the transmission lines. By the method and the terminal equipment, the testing frequency of the dielectric constant can be greatly improved, test of wide-broadband dielectric constant is supported, the testing efficiency is improved, and the test is simplified.

Description

technical field [0001] The invention belongs to the technical field of measuring physical characteristics of semiconductor materials, and in particular relates to a dielectric constant extraction method and terminal equipment based on coplanar waveguide transmission lines. Background technique [0002] Solid-state microwave power devices refer to GaAs, GaN, InP and other devices that work in the microwave and millimeter wave frequency range. Compared with traveling wave tube devices, they have the advantages of small size, low power consumption, high efficiency, and low noise. Widely used in the military field. When designing solid-state microwave power devices, it is usually necessary to input parameters such as the dielectric constant and loss tangent of the substrate material (semiconductor) for circuit simulation. For example, for GaAs devices, the effective dielectric constant is usually 12.8 or 12.9. However, since the dielectric constant of the actual substrate is a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26
CPCG01R27/2617
Inventor 王一帮栾鹏吴爱华梁法国霍烨
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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