Mass rapid measurement method for irregular leaf areas
A technology of leaf area and measuring method, applied in the direction of measuring devices, instruments, etc., can solve the problems of insufficient expansion of tobacco leaves, large manpower and time, and complicated operation, so as to reduce the difficulty and intensity of work, ensure accuracy, and reduce difficulty. Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0019] A large batch rapid measurement method of irregular leaf area, the measurement method includes four steps, the first step is to prepare and select samples, the second step is to test the area and weight of the sample taken, and the third step is to establish the relationship between leaf area and leaf weight The standard curve, the fourth step is to test the area of single-grade leaves of this batch in large quantities.
Embodiment 2
[0021] A large batch of rapid measurement method for irregular leaf area described in Example 1, the first step of preparing and selecting samples is to balance the single-grade leaves to be measured to the balance under the environment under constant temperature and humidity conditions Moisture content, and then randomly select a certain number of representative samples from the material to be tested for use.
Embodiment 3
[0023] A large batch of rapid measurement method for irregular leaf area described in Example 2, the first step of preparing and selecting samples is to balance the single-grade leaf to be measured to Equilibrium moisture content in this environment, and then randomly select 1~3Kg representative samples from the materials to be tested for future use.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com