Ultra-high temperature material spectral emissivity measuring system and using method thereof

A technology of spectral emissivity and measurement system, which is applied in the field of ultra-high temperature material spectral emissivity measurement system, can solve problems such as errors and difficulty in direct measurement of spectral radiance, and achieve improved measurement accuracy, guaranteed temperature stability, and guaranteed measurement accuracy Effect

Inactive Publication Date: 2018-05-08
BEIJING INST OF ENVIRONMENTAL FEATURES
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Problems solved by technology

Through practical experiments, in operation, the spectral radiance of the target in the direction

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  • Ultra-high temperature material spectral emissivity measuring system and using method thereof
  • Ultra-high temperature material spectral emissivity measuring system and using method thereof
  • Ultra-high temperature material spectral emissivity measuring system and using method thereof

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Embodiment Construction

[0040] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below with reference to the accompanying drawings and preferred embodiments. However, it should be noted that many of the details listed in the specification are only for readers to have a thorough understanding of one or more aspects of the present invention, and these aspects of the present invention can be implemented even without these specific details.

[0041] The ultra-high temperature material spectral emissivity measurement system provided in this embodiment includes infrared spectral radiation measurement equipment, a computer control system, a blackbody radiation source, a temperature control system and an auxiliary optical path system; a sample slot and a blackbody cavity are arranged on the temperature control system, and Process diagram such as figure 1 As shown, the sample in the sample chamber in the s...

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Abstract

The invention discloses an ultra-high temperature material spectral emissivity measuring system and a using method thereof. The measuring system comprises an infrared spectrum radiation measuring device, a computer control system, a blackbody radiation source, a temperature control system and an auxiliary optical path system. A sample slot and a blackbody cavity hole are arranged on the temperature control system, and a sample in the sample slot is heated to a set temperature. The computer control system controls the auxiliary optical path system, the radiation of the sample and the radiationof the blackbody radiation source placed in the blackbody cavity hole at that time are reflected to the infrared spectrum radiation measuring device, the radiation measurement is carried out, and thespectral emissivity of the sample is calculated and obtained through the computer control system. The spectral emissivity measurement of an ultra-high temperature material can be achieved through integrated design, and at the same time, the measurement accuracy of the spectral emissivity of the measured sample can be greatly improved by using the technology of reducing background radiation.

Description

technical field [0001] The invention relates to the field of optoelectronics, in particular to a system for measuring the spectral emissivity of ultra-high temperature materials and a method for using the same. Background technique [0002] Spectral emissivity is an important thermophysical parameter that characterizes the spectral radiation characteristics of the material surface. The method used by the ultra-high temperature material spectral emissivity measurement system is: the definition method to measure the infrared spectral emissivity when the target temperature is 150 ° C ~ 1000 ° C, that is, the spectral measurement equipment is used to directly measure the radiance of the sample and the standard black body in the detection instrument The response value in . Through practical experiments, in operation, the spectral radiance of the target in the radiation transmission direction is difficult to be directly measured, and its value has certain errors. Contents of th...

Claims

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Application Information

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IPC IPC(8): G01J5/08G01J1/00
CPCG01J5/0887G01J1/00
Inventor 郭聚光
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
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