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Terahertz time-domain spectrum measuring system

A terahertz time-domain and spectral measurement technology, which is applied to measuring devices, material analysis through optical means, instruments, etc., can solve the problems of high cost of devices, high requirements for optical axis stability, and difficulties in optical path installation and adjustment, and reduce The effect of reducing the cost of components, reducing the difficulty of optical path installation and adjustment, and reducing stringent requirements

Active Publication Date: 2018-05-08
HUBEI JIUZHIYANG INFRARED SYST CO LTD
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Problems solved by technology

[0012] Aiming at the problems that the existing terahertz time-domain spectroscopy system design requires high optical axis stability, difficult installation and adjustment of optical paths, and expensive components, the present invention provides a terahertz time-domain spectroscopy measurement system to solve the above problems

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] figure 1 Shown is a block diagram of an embodiment of the present invention.

[0025] This embodiment includes a femtosecond laser system 1 , a terahertz emission device 2 , a terahertz detection device 3 , a sample measurement device 4 , and a delay scanning device 5 .

[0026] The femtosecond laser system 1 outputs two beams of pump laser light and probe laser light with the same repetition frequency and fixed relative delay, which are respectively transmitted to the terahertz emission device 2 and the terahertz detection device 3 through an optical fiber or a free space optical path, res...

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Abstract

The invention discloses a terahertz time-domain spectrum measuring system which comprises a femtosecond laser system, a terahertz emitting device, a terahertz detection device, a sample measuring device and a time delay scanning device, wherein pumping laser and detection layer are output from the femtosecond laser system and are respectively transmitted to the terahertz emitting device and the terahertz detection device to generate terahertz waves; the terahertz detection device is used for receiving terahertz wave beams and used for converting the terahertz wave beams into voltage signals; the sample measuring device is positioned in a terahertz optical path and is used for controlling the terahertz wave beams to enter a sample; the time delay scanning device is used for changing a propagation optical path of the terahertz wave beams between the terahertz emitting device and the terahertz detection device. By adopting the system, the harsh requirements of optical reflection surface roughness and movement mechanism stability in the time delay scanning device are remarkably degraded, the optical path mounting and regulating difficulties are reduced, and the device cost of the terahertz time-domain spectrum measuring system is greatly reduced.

Description

technical field [0001] The invention relates to the application field of terahertz waves, in particular to a terahertz time-domain spectrum measurement system. Background technique [0002] In the terahertz time-domain spectroscopy measurement system, in order to realize the complete waveform sampling of the sub-picosecond width terahertz pulse, it is necessary to adopt the pump-probe technology with ultra-fast time analysis capability. The implementation of this technology requires an optical delay scanning device in the terahertz time-domain spectroscopy measurement system to change the relative delay between the probe light and the terahertz pulse. [0003] In order to achieve the above purpose, among the various technical solutions that have been reported, the optical delay scanning device is usually designed and installed in the optical path of the femtosecond laser, and by changing the optical path of the pump laser or the probe laser, the probe light and the terahertz...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3586
CPCG01N21/3586
Inventor 袁英豪杨建强李超熊波涛周正陈师雄
Owner HUBEI JIUZHIYANG INFRARED SYST CO LTD
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