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STED (stimulated emission depletion) parallel microscopic imaging system based on uniform structured illumination

A technology of structured light illumination and microscopic imaging, used in microscopes, material analysis by optical means, optics, etc., can solve the problems of reducing the effective fluorescence signal-to-noise ratio, affecting the imaging resolution, and increasing the complexity of the imaging system. The effect of expanding the field of view and imaging speed, high imaging resolution and fast imaging speed

Active Publication Date: 2018-06-19
SUZHOU GUOKE MEDICAL TECH DEV CO LTD +1
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AI Technical Summary

Problems solved by technology

However, due to the addition of two-dimensional structured light, the complexity of the imaging system becomes higher, and the excitation light in this technology does not use structured light mode but uses wide-field excitation, which significantly reduces the signal-to-noise ratio of effective fluorescence and affects the imaging resolution.

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  • STED (stimulated emission depletion) parallel microscopic imaging system based on uniform structured illumination
  • STED (stimulated emission depletion) parallel microscopic imaging system based on uniform structured illumination
  • STED (stimulated emission depletion) parallel microscopic imaging system based on uniform structured illumination

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Embodiment Construction

[0029] Please refer to figure 1 , is a STED parallel microscopic imaging system 100 based on uniform structured light illumination provided by an embodiment of the present invention, an illumination module 110 , a detection module 120 , a control module 130 and an image reconstruction module 140 . in:

[0030] The illumination module 110 includes: an excitation light laser 111, a loss light laser 112, a first flat-top Gaussian beam shaper 113, a second flat-top Gaussian beam shaper 114, a liquid crystal spatial light modulator 115, and a Wollaston prism 116 , the first lens 117, the second lens 118, the first mirror 119, the third lens 1111, the through-hole mask 1112, the fourth lens 1113, the first half-wave plate 1114, the second mirror 1115, the first two Chromatic mirror 1116, the fifth lens 1117, the sixth lens 1118, the second half-wave plate 1119, the second dichroic mirror 1121, the tube lens 1122, the objective lens 1123 and the three-dimensional nano-displacement s...

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Abstract

The invention provides an STED (stimulated emission depletion) parallel microscopic imaging system based on uniform structured illumination. By designing an illumination module, an exciting light beamemitted by an exciting light laser is divided into two coherent light beams, a depletion light beam of Gaussian distribution is modulated into a flattened beam by a flattened Gaussian beam shaper andis divided into two coherent light beams, uniformly distributed streaky exciting structured light and depletion structured light are obtained respectively by interference, excitation and depletion are performed on a sample, STED parallel microscopic imaging is performed, then image reconstruction is performed with an STED coordinate positioning method and an SIM frequency domain and spectrogram fusion method, super-resolution imaging is realized, and the field range and the imaging speed of the STED microscopic system can be increased.

Description

technical field [0001] The invention relates to the field of design and manufacture of microscopic detection instruments, in particular to a STED parallel microscopic imaging system based on uniform structured light illumination. Background technique [0002] Super-resolution microscopic imaging technology is a cutting-edge technology used in biological and other research fields. It is mainly divided into two types of microscopic imaging methods: coordinate positioning and coordinate random. Among them, the typical representative of the coordinate positioning microscopic imaging method is stimulated radiation depletion (STED) microscopic imaging. STED microscopic imaging directly uses optical methods to scan the sample point by point to achieve super-resolution imaging. However, limited by the single-point scanning method, the imaging speed of STED microscopic imaging is relatively slow. [0003] In recent years, in order to improve the imaging speed of STED microscopic ima...

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Application Information

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IPC IPC(8): G01N21/01G01N21/64G02B21/00
CPCG02B21/002G01N21/01G01N21/64G01N2021/0112
Inventor 唐玉国张运海肖昀
Owner SUZHOU GUOKE MEDICAL TECH DEV CO LTD
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