STED (stimulated emission depletion) parallel microscopic imaging system based on uniform structured illumination
A technology of structured light illumination and microscopic imaging, used in microscopes, material analysis by optical means, optics, etc., can solve the problems of reducing the effective fluorescence signal-to-noise ratio, affecting the imaging resolution, and increasing the complexity of the imaging system. The effect of expanding the field of view and imaging speed, high imaging resolution and fast imaging speed
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[0029] Please refer to figure 1 , is a STED parallel microscopic imaging system 100 based on uniform structured light illumination provided by an embodiment of the present invention, an illumination module 110 , a detection module 120 , a control module 130 and an image reconstruction module 140 . in:
[0030] The illumination module 110 includes: an excitation light laser 111, a loss light laser 112, a first flat-top Gaussian beam shaper 113, a second flat-top Gaussian beam shaper 114, a liquid crystal spatial light modulator 115, and a Wollaston prism 116 , the first lens 117, the second lens 118, the first mirror 119, the third lens 1111, the through-hole mask 1112, the fourth lens 1113, the first half-wave plate 1114, the second mirror 1115, the first two Chromatic mirror 1116, the fifth lens 1117, the sixth lens 1118, the second half-wave plate 1119, the second dichroic mirror 1121, the tube lens 1122, the objective lens 1123 and the three-dimensional nano-displacement s...
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