A method and medium for determining the electrical characteristics of an organic thin film transistor
A technology of electrical characteristics and transistors, applied in the direction of measuring electricity, measuring electrical variables, semiconductor characterization, etc., can solve problems such as limited applications
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[0046]The technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the present disclosure, rather than all of them. Based on the embodiments of the present disclosure, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts also fall within the protection scope of the present disclosure.
[0047] "First", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. Likewise, "comprising" or "comprises" and similar words mean that the elements or items appearing before the word include the elements or items listed after the word and their equivalents, and do not exclude other elements or items. Words such as "connected" or "connected" are not limited to phys...
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