Calculation method of spatial circuit distribution parameter matrix based on complex image
A matrix calculation and parameter distribution technology, which is applied in the direction of capacitance measurement, measuring devices, instruments, etc., can solve problems such as inductance and resistance parameter errors, and achieve the effect of solving errors
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[0039] The present invention includes the following steps:
[0040] (1) First, in order to have a clearer description of the distribution parameters between the spatial lines, each line is numbered and segmented;
[0041] (2) Secondly, collect the relevant parameters of the space line for the numbered line, mainly including: the radius of the wire, the DC resistance of the wire, the tower model, the three-dimensional coordinates of the tower, and the soil resistivity;
[0042] (3) Again, according to the collected spatial line related parameters, the average potential method is used to calculate the self-potential coefficient of each line and the mutual potential coefficient between lines, and the potential matrix is obtained according to the calculated potential coefficient, and then the potential matrix is inverted Get the capacitance matrix;
[0043] (4) Finally, calculate the self-impedance parameters of each line according to the complex mirroring method, and then calculate t...
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