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Industrial X-ray flaw detection-based welding defect negative assessment method for teaching

A technology of welding defects and X-rays, which is applied in the direction of material analysis using radiation, special data processing applications, instruments, etc., can solve the problems of slow speed, poor accuracy, manual evaluation, etc., and achieve the effect of fast speed and simple calculation

Inactive Publication Date: 2018-09-28
JIANGSU MARITIME INST
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Problems solved by technology

[0002] Industrial X-ray flaw detector is one of the most widely used industrial equipment in various industries at present, but due to its certain radiation, it is difficult for schools to use real equipment for teaching
And after using the X-ray flaw detector to perform flaw detection operations, it is necessary to grade the negatives. As a very important step, negative film rating is very important, but it is currently in the state of manual evaluation, and its accuracy is poor and the speed is very slow.

Method used

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  • Industrial X-ray flaw detection-based welding defect negative assessment method for teaching

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specific Embodiment

[0032] Specific embodiment: two circular defects are arranged on a film, and the process of its assessment is:

[0033] Input: the thickness of the plate is 24, the long diameter of defect 1 is 4.1, and the long diameter of defect 2 is 3;

[0034] Evaluation process: the evaluation area is 10*10, 10 points for defect 1; 3 points for defect 2; the final point is 13;

[0035] The overall rating is level 3. The unit of the above-mentioned length is mm.

[0036] In actual operation, a defect with an aspect ratio less than or equal to 3 is defined as a circular defect. The circular defect can be round, oval, conical, or irregular in shape with a tail, including pores, slag inclusions, etc. and clip tungsten.

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Abstract

The invention specifically relates to an industrial X-ray flaw detection-based welding defect negative assessment method for teaching. The method comprises the following steps of automatically obtaining a welding negative numerical value; performing error analysis on a welding negative parameter; performing grade assessment on different types of welding defects; performing secondary operation grading on the welding negative numerical value; when different defect types exist in a single negative, outputting the grade of each defect; and if part of defect numerical values exceed a preset numerical value range, performing the fourth step of performing secondary operation grading on the defects. The single negative is subjected to comprehensive calculation grading; if the negative has the twotypes of the defects, the grade of the single negative is a grade obtained by subtracting 1 from the sum of the grades of the two defects after grading; if the negative has the three types of the defects, the grade of the single negative is a grade obtained by subtracting 2 from the sum of the grades of the three defects after grading; and a comprehensive calculation result is output. The method is simple and quick in calculation, thereby being suitable for use in daily teaching.

Description

technical field [0001] The invention relates to the field of flaw detectors for teaching, in particular to a method for evaluating welding defect films of industrial X-ray flaw detection for teaching. Background technique [0002] Industrial X-ray flaw detector is one of the most widely used industrial equipment in various industries at present, but due to its certain radiation, it is difficult for schools to use real equipment for teaching. And after using the X-ray flaw detector to carry out the flaw detection operation, it is necessary to grade the negative film. As a very important step, the negative film rating is very important, but it is currently in the state of manual evaluation, and its accuracy is poor and the speed is very slow. Contents of the invention [0003] 1. Technical problems to be solved: [0004] In view of the above existing problems, the present invention proposes a method for evaluating welding defect negatives for industrial X-ray flaw detection...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G01N23/04
CPCG01N23/04G06F30/20
Inventor 刘军华刘宇齐于宁徐明亮尚振一谢帅涛李伟朱雪迪蔡厚平李不同李雨桐
Owner JIANGSU MARITIME INST
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