Industrial X-ray flaw detection-based welding defect negative assessment method for teaching
A technology of welding defects and X-rays, which is applied in the direction of material analysis using radiation, special data processing applications, instruments, etc., can solve the problems of slow speed, poor accuracy, manual evaluation, etc., and achieve the effect of fast speed and simple calculation
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
specific Embodiment
[0032] Specific embodiment: two circular defects are arranged on a film, and the process of its assessment is:
[0033] Input: the thickness of the plate is 24, the long diameter of defect 1 is 4.1, and the long diameter of defect 2 is 3;
[0034] Evaluation process: the evaluation area is 10*10, 10 points for defect 1; 3 points for defect 2; the final point is 13;
[0035] The overall rating is level 3. The unit of the above-mentioned length is mm.
[0036] In actual operation, a defect with an aspect ratio less than or equal to 3 is defined as a circular defect. The circular defect can be round, oval, conical, or irregular in shape with a tail, including pores, slag inclusions, etc. and clip tungsten.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com