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High Precision Langmuir Probe

A Langmuir probe, high-precision technology, applied in the direction of plasma, electrical components, etc., can solve problems such as the easy conduction between the collector and the protection ring, and the loss of the collector's ability to work

Active Publication Date: 2020-01-03
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The first purpose of the present invention is to provide a high-precision Langmuir probe, to alleviate the collector used for collecting in the Langmuir probe used in the prior art and the protective ring are easy to conduct and cause the collector to lose work capacity and other technical issues

Method used

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  • High Precision Langmuir Probe
  • High Precision Langmuir Probe
  • High Precision Langmuir Probe

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Embodiment 1

[0037] Such as Figure 1-Figure 6 As shown, the high-precision Langmuir probe provided by this embodiment includes a collector 10 and a protective ring 20; the protective ring 20 is provided with a through hole 201 for the collector 10 to pass through, and the collector 10 is covered with a spacer 30. And the isolation sleeve 30 is located between the collector 10 and the protection ring 20 ; the isolation sleeve 30 is provided with a receiving portion 301 , and the receiving portion 301 is used to receive the plume pollutants entering the installation gap between the collector 10 and the isolation sleeve 30 .

[0038] Specifically, the high-precision Langmuir probe includes a collector 10 and a protective ring 20, the collector 10 is a component for collecting plasma, the protective ring 20 is a component for protecting the collector 10, and the protective ring 20 It is arranged on the outside of the collector 10; when in use, the high-precision Langmuir probe is placed in th...

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Abstract

The invention provides a high-precision Langmuir probe and relates to the technical field of plasma detection equipment. The high-precision Langmuir probe includes a collector and a protection ring; the protection ring is provided with a through hole penetrable for the collector,the collector is sleeved with an insulating sleeve,and the insulating sleeve is positioned between the collector and theprotection ring; a bearing part is arranged on the insulating sleeve and used for bearing plume pollutants entering installation gaps between the collector and the insulating sleeve in order to solvethe technical problem that since collectors used for collecting and protection rings in Langmuir probes applied in the prior art are easily communicated with each other,the working capability of thecollectors are disabled.

Description

technical field [0001] The invention relates to the technical field of plasma detection equipment, in particular to a high-precision Langmuir probe. Background technique [0002] Electric thrusters such as ion thrusters and Hall thrusters are widely used in attitude and orbit control of spacecraft due to their advantages of high specific impulse, long life and small thrust. Therefore, accurate acquisition of vacuum plume parameters of electric thrusters is crucial It is crucial to evaluate the performance of electric thrusters and spacecraft; the vacuum plume of electric thrusters is plasma, and the electron temperature and electron number density are the basic parameters of the plasma plume flow field. Obtaining electron temperature and electron number density is the research An important prerequisite for plasma properties, Langmuir probes are usually used in the prior art to diagnose the electron temperature and electron number density of the vacuum plume flow field of iso...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H05H1/00
CPCH05H1/0075
Inventor 贺碧蛟韩木天郑鸿儒凌贵龙翁惠焱
Owner BEIHANG UNIV