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Photosensitive chip testing method and equipment based on charge calculation

A technology of photosensitive chips and testing methods, which can be applied to televisions, electrical components, image communications, etc., and can solve problems such as inability to accurately test photosensitive chips

Active Publication Date: 2021-03-02
NINGBO SUNNY OPOTECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a photosensitive chip testing method based on charge calculation, which can solve the problem that the existing solutions cannot accurately test the photosensitive chip

Method used

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  • Photosensitive chip testing method and equipment based on charge calculation
  • Photosensitive chip testing method and equipment based on charge calculation
  • Photosensitive chip testing method and equipment based on charge calculation

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Embodiment Construction

[0078] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0079] like figure 1 As shown, the present invention provides a kind of photosensitive chip testing method based on electric charge calculation, comprises the SNR (Signal Noise Ratio) 10 test of photosensitive chip, and described SNR 10 test comprises:

[0080] In different environmental illuminances, use a camera module to shoot an 18% gray card (Grey Chart) image, and extract the signal value of 100x100 pixels (pixel) in the center of the gray card image, wherein the camera module includes a photosensitive chip;

[0081] Carry out white balance (WB), color correction matrix (CCM) and interpolation calculation successively by the signal value of 100x100 pixel of described gray card image center, obtain the signal value after proc...

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Abstract

The present invention provides a photosensitive chip testing method and equipment based on charge calculation. The present invention passes the photosensitive chip's performance-to-noise ratio test of 10, the photosensitive chip's full charge capacity test, the photosensitive chip's photosensitivity test, and the photosensitive chip's dynamic range test. And the dark noise test of the photosensitive chip can get a feel for the effect of the photosensitive chip, which can be used as a reference for model selection and matching to enhance user experience.

Description

technical field [0001] The invention relates to a test method for a photosensitive chip based on electric charge calculation. Background technique [0002] As the most important part of the camera components, the photosensitive chip determines the quality of the camera. If the photosensitive chip fails at the slightest degree, it will bring serious consequences to the entire camera system. The light ones will have poor camera effects. In severe cases, the entire camera must be scrapped and returned in batches, which will affect the user experience. [0003] At present, the testing of the photosensitive chip in the industry is based on the evaluation of the camera module level. Due to the packaging limitation of the photosensitive chip, the module factory cannot test the effect of the chip when the chip is supplied. Only when the chip is made into a module sample can the test be carried out, but the test is mostly limited to the module application level such as resolution, s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00
CPCH04N17/002
Inventor 张露萍蔡赞赞陈玮逸夫
Owner NINGBO SUNNY OPOTECH CO LTD