A Segmental Judgment Method for Bypass Events

Abstract

A segmented judging method for a bypass event, characterized in that it comprises the following steps: (1) pre-dividing multiple segmented intervals according to the magnitude of the phase current, and setting different bypass thresholds in each segmented interval; (2) Read the maximum phase current from the phase current register of the metering chip; (3) Determine the subsection where the maximum phase current is located and obtain the bypass threshold; (4) Read the three-phase current vector from the metering chip current vector and register and, and read the zero-phase current from the zero-phase current register of the metering chip; (5) make a vector sum of the three-phase current vector sum and the zero-phase current, and judge whether a bypass event occurs. The segmental judging method of the bypass event is simple in operation and is not easy to cause misjudgment when the current is increased.

Description

technical field [0001] The invention relates to the technical field of circuit detection, in particular to a segmented judging method of a bypass event. Background technique [0002] There are mainly two methods for judging the existing bypass event: [0003] 1. Calculate the angle between the currents of each phase according to the voltage phase angle and power angle, and then calculate the vector sum of each phase current and the neutral line current, and judge whether a bypass event occurs according to whether the vector sum is zero. [0004] 2. Read the three-phase current vector sum from the current vector sum register of the metering chip, and then make a difference with the zero-phase current. If the difference is greater than 2A, it is determined that a bypass event has occurred. [0005] However, the existing bypass event judgment methods have the following technical problems: scheme 1 has high complexity and increases the computing load of the main chip; scheme 2,...

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Problems solved by technology

[0005] However, the existing bypass event judgment methods have the following technical problems: scheme 1 has high complexity and increases the computing load of the main chip; scheme 2, in the case of increasing the current, the three-phase current vector read from the metering chip The error of the sum is large, which is easy to cause misjudgment

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