Low-power device duration of service testing method
A technology of low power consumption and equipment, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of inaccurate power consumption test of low power consumption equipment, inaccurate calculation of working life, etc., and achieve the effect of improving the service life
Pending Publication Date: 2018-11-16
CHINA ELECTRIC POWER RES INST +3
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Problems solved by technology
[0005] The purpose of the present invention is to solve the problem that the power consumption test of low-power equipment is not accurate, and the normal working life of the equipment after using the battery cannot be accurately calculated.
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[0026] Exemplary embodiments of the present invention will now be described with reference to the drawings; however, the present invention may be embodied in many different forms and are not limited to the embodiments described herein, which are provided for the purpose of exhaustively and completely disclosing the present invention. invention and fully convey the scope of the invention to those skilled in the art. The terms used in the exemplary embodiments shown in the drawings do not limit the present invention. In the figures, the same units / elements are given the same reference numerals.
[0027] Unless otherwise specified, the terms (including scientific and technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it can be understood that terms defined by commonly used dictionaries should be understood to have consistent meanings in the context of their related fields, and should not be understood as idealized or over...
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The invention discloses a low-power device duration of service testing method, and belongs to the device testing technical field; the method comprises the following steps: 1, start testing, and connecting a low power device with a power testing device; 2, reading a static state power Ps, a battery voltage U and a current Is of the low power device in a sleep mode; 3, reading a power Pw and a current Iwi of the low power device in a high frequency working mode; 4, running the low power device in a simulation real environment, adding the power consumed in a time period of the device when a classic state is triggered, thus obtaining the power P of a normal mode within a unit time t; 5, dividing a battery capacity Q of the tested low power device by the normal state power of the unit time, andcalculating the duration of service T of the tested device used in field. The method can accurately measure the running power of the low power device under different running modes in a lab, thus further calculating the duration of service T of the low power device operated in field.
Description
technical field [0001] The invention relates to the field of equipment testing, in particular to a method for testing the service life of low-power equipment. Background technique [0002] With the development of the Internet of Things technology, the Internet of Things is affecting all aspects of our lives, and a variety of electronic devices are used and interconnected in various forms. IoT devices basically have low power consumption characteristics, and battery life is the biggest challenge for IoT devices, so the service life test of low-power devices becomes particularly important. [0003] The present invention is aimed at the field of testing low-power devices. Compared with non-low-power devices, the operating current range of low-power devices is wider, from a few microamperes in sleep to milliamps or even amperes in operation. More accurate measurement is required to obtain the average power consumption of the device for normal operation. [0004] Existing power...
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Login to View More IPC IPC(8): G01R22/06
CPCG01R22/06
Inventor 巫钟兴祝恩国邹和平郑安刚刘兴奇张宇鹏许岳楼马亚彬叶方彬庄磊杨乐王朝亮王伟峰周利华张丽楠韩月
Owner CHINA ELECTRIC POWER RES INST