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High-reliability self-checking circuit for chip protection device

A technology of protection device and self-checking circuit, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve problems such as high cost and long supply cycle, and achieve the goal of improving coverage, improving applicable scenarios, and improving reliability. Effect

Inactive Publication Date: 2018-11-16
STATE GRID LIAONING ELECTRIC POWER RES INST +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

More than 90% of the core chips in the current power system rely on imports, and there is a problem of high cost and long delivery cycle

Method used

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  • High-reliability self-checking circuit for chip protection device

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Embodiment Construction

[0031] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention. Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations thereof such as "includes" or "includes" and the like will be understood to include the stated elements or constituents, and not Other elements or other components are not excluded.

[0032] The word "exemplary" is used exclusively her...

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Abstract

The invention relates to the field of integrated circuit technology, in particular, to a high-reliability self-checking circuit for a chip protection device. The self-checking circuit comprises a protection core, a communication core and a self-check logic. The protection core consists of a protection logic circuit and a protection MCU core; the communication core includes a communication logic circuit and a communication MCU core; the self-check logic and the communication core are connected through a debugging interface of the communication core; and the self-checking logic and the protection core are connected through a debugging interface of the protection core. A self-checking electrical quantity generated by the communication core is outputted through an IO port of the communicationcore. The protection core and the communication core carry out data interaction by means of memory sharing and carry out control interaction by an interrupt signal and an IO port. The rest of connection is linear connection. Therefore, the reliability of the protection device is improved greatly; high simulation of the normal working state of the protection device is realized; the coverage rate ofthe self-checking function is improved; different fault simulation programs are loaded according to the specific protection scenes; and the applicable scene of the protection device is extended.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a highly reliable chip protection device self-test circuit. Background technique [0002] At present, the technology related to smart substation has made great progress. Electronic transformers, merging units, intelligent terminals and other new equipment are widely used. The layout of intelligent IED equipment is transitioning from secondary small rooms to outdoor cabinets and prefabricated cabins. The application of new technologies and new equipment and the installation methods The changes have created new problems for secondary majors. Too many intermediate transmission nodes in conventional relay protection lead to a decrease in the quickness index of relay protection; the secondary equipment installed in the outdoor cabinet has a low protection level and a high failure rate. [0003] The on-site miniaturized device can reduce the intermediate links of data tra...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 王峥王于波李良刘国华于同伟葛维春李延丁岳张武洋卢岩杨文耿亮刘柱
Owner STATE GRID LIAONING ELECTRIC POWER RES INST
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