Method for evaluating brightness measuring precision of DeMura equipment

A technology of measurement accuracy and brightness measurement, applied in the fields of instruments, electrical digital data processing, digital data processing components, etc., can solve problems such as difficult quantification, difficult implementation, and no unified standard, and achieve the effect of high accuracy

Active Publication Date: 2018-11-16
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology

[0003] In the prior art, the performance evaluation of OLED DeMura equipment uses methods such as SNR, crosstalk value, and human eye viewing compensation effect, but there is no unified standard
The SNR index can reflect the measurement repeatability of DeMura equipment, that is, the deviation of multiple measurement values, but it cannot accurately reflect the measurement accuracy of DeMura equipment, that is, the deviation between the measured value and the true value
The crosstalk value index can reflect the measurement space accuracy of Demura equipment, but it also cannot accurately reflect the measurement accuracy of Demura equipment
The way the human eye sees the compensation effect is the ultimate standard for detecting the quality of Demura equipment, but it is affected by human subjective feelings and interfered by the compensation algorithm, so it is difficult to quantify and implement
[0004] Existing technology cannot accurately evaluate the repair effect of DeMura equipment on Sandy Mura (sandy Mura) and other Mura; testing, scientific research and production in the field of LCD panels have put forward an urgent need for technologies that accurately evaluate the measurement accuracy of DeMura equipment brightness data

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  • Method for evaluating brightness measuring precision of DeMura equipment
  • Method for evaluating brightness measuring precision of DeMura equipment

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0024] The method for evaluating the brightness measurement accuracy of DeMura equipment provided by the embodiment includes the following steps:

[0025] (1) The OLED panel is driven by a signal generator to display multiple images of different gray scales;

[0026] (2) Extract the luminance data of each sub-pixel of each of the above-mentioned image frames displayed by the OLED panel through ...

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Abstract

The invention discloses a method for evaluating the brightness measuring precision of DeMura equipment. A random number is added to an original grayscale image to generate a noise-added image, a measuring value corresponding to the added random number is obtained via the noise-added image displayed by the DeMura equipment, the brightness measuring precision of the DeMura equipment is evaluated according to correlation between the measuring value and the originally added random number, and the brightness extracting performance of the DeMura equipment. Compared with SNR or CrossTalk test evaluation methods in the prior art, the method of the invention can obtain deviation of the measuring value from a practical value, and can be used to reflect the practical performance of the DeMura equipment quantitatively.

Description

technical field [0001] The invention belongs to the technical field of OLED display panel defect identification, and more specifically relates to a method for evaluating the measurement accuracy of brightness data of DeMura equipment. Background technique [0002] OLED (Organic Light Emitting Diode) Demura (Mura Elimination) equipment is used to extract the brightness of OLED panels, calculate compensation data, perform external compensation for Mura defects that occur in OLED panel production, reduce or eliminate Mura defects, and improve product display effects and yields . Since the difference in the brightness extraction accuracy of Demura devices will directly affect the compensation effect, it is necessary to evaluate the performance of this type of device; the accuracy here refers to the accuracy of the sub-pixel brightness extraction of the display panel, that is, the sub-pixel brightness of the display panel The deviation between the measured value and the true val...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00
CPCG09G3/006G09G2360/145G06F7/588G09G3/2003G09G2300/0452G09G2320/0276G09G2320/0673
Inventor 冯晓帆郑增强刘钊马尔威吴红君刘荣华沈亚非
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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