Pulse autocorrelation measurement device and measurement method based on single-layer graphene

Abstract

The invention provides an ultrashort pulse self-correlation measuring device and measuring method based on single-layer graphene. The device includes a first collimating lens and a polarizing beam splitter in sequence along a direction of pulsed light to be measured, the polarizing beam splitter splits input light into two paths of signal light to be output, a first reflector and a second collimating lens are arranged in sequence along the first path of signal light and converge to a common point of a single-layer graphene film, the single-layer graphene film is pasted on a front surface of aglass substrate, and a second reflector, a controllable delay reflector, a third reflector and a third collimating lens are arranged in sequence along the second path of signal light and converge to acommon point of the single-layer graphene film and output to a photodetector. An output end of the photodetector is connected with a computer through a data acquisition card, and an output end of thecomputer is connected with a control end of the controllable delay reflector. The ultrashort pulse self-correlation measuring device based on single-layer graphene is simple in structure, can suppress pulse broadening caused by the thickness of a nonlinear material in an existing self-correlation technology, and realizes self-correlation measurement of ultrashort pulse width.

Description

technical field [0001] The invention relates to pulse width autocorrelation measurement, in particular to a single-layer graphene-based ultrashort pulse autocorrelation measurement device and measurement method. Background technique [0002] In recent years, due to the wide application of ultrashort pulses in optical communication, optical sensing, light radar, microwave photonics, etc., a large number of scholars have been attracted to study the important parameter of pulse width. Autocorrelation technology is a widely used technique for measuring pulse width. The autocorrelation technology divides the pulse into two paths, and the two paths of pulses act together on a certain nonlinear medium. As the delay between the two paths of pulses changes, the response of the nonlinear medium itself changes accordingly. Width is measured. [0003] At present, there are two main types of autocorrelation measurement techniques: [0004] Method 1 is to use a frequency doubling cryst...

AI Technical Summary

Problems solved by technology

The measurement of the optical pulse width by this method is limited by the wavelength and power range of the semiconductor device itself

At the same time, the typical relaxation time of semiconductor materials is from picoseconds to sub-nanoseconds, and the thickness of microns also broadens the pulse to a certain extent, which limits the shortest pulse width that can be measured.

[0006] In short, the above methods either have large wavelength dependence, high cost, and poor integration, or have restrictions on the input pulse wavelength and power, and the shortest measurable pulse width is limited.

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