Multi-channel high-temperature dielectric temperature spectrum testing device

Abstract

The invention discloses a multi-channel high-temperature dielectric temperature spectrum testing device. The multi-channel high-temperature dielectric temperature spectrum testing device comprises a clamp and detection equipment electrically connected with the clamp; the clamp at least comprises a clamping mechanism and a heat insulating plate (4); the clamping mechanism further comprises a stainless steel bottom plate (10); a silver electrode bottom plate is fixedly arranged on the stainless steel bottom plate (10) to serve as a silver bottom electrode (7) shared by a plurality of channels; each channel is independently provided with a thermocouple (2), one end of each thermocouple (2) is buried in the silver bottom electrode (7), and the other end of each thermocouple (2) is electricallyconnected with the detection equipment; each channel is provided with a silver bolt top electrode (5); and a tested sample is clamped between the silver bolt top electrodes (5) and the silver bottomelectrode (7) and tightly fixed through tightness degree adjusting by a fixing mechanism. By adopting the technical scheme, the temperature of the sample can be accurately measured, the testable temperature range is large, the dielectric performance of a material at different temperatures is tested, and the cost is low.

Description

technical field [0001] The invention relates to the technical field of material performance testing, in particular to a multi-channel high-temperature dielectric thermospectral testing device. Background technique [0002] Electronic materials play an important role in today's high-tech fields. The continuous development of the level of science and technology has put forward higher requirements for the performance of electronic materials, and accordingly, higher requirements have been put forward for the testing equipment of electronic materials. [0003] Among them, dielectric properties are extremely important characteristics of dielectric materials. In practical applications, the dielectric constant and dielectric loss of dielectric materials are very important parameters. Manufacturing different devices requires different dielectric constants and dissipation factors. Dielectric loss and dielectric loss are an important physical property of various materials. By measur...

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Problems solved by technology

[0006] In view of this, in order to overcome the shortcomings of the above-mentioned prior art, the present invention provides a multi-channel high-temperature dielectric thermometry testing device, which can effectively solve the problem of inaccurate temperature measurement during the sample testing process, and can Test the dielectric properties of the samples in the temperature range, so as to better reflect the actual performance of the material in the use environment, and the manufacturing cost is low

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