A sram memory cell circuit with high stability and low static power consumption

A storage unit circuit, low static power consumption technology, applied in the direction of static memory, information storage, digital memory information, etc., can solve the problems of easy failure of writing operation, half-selection of reading and writing, limited reading and writing ability, etc., to achieve solution Half-selection problem, low static power consumption, and the effect of improving soft error rate

Inactive Publication Date: 2021-10-26
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the mainstream unit structure of SRAM storage unit is 6T structure, such as figure 1 The schematic diagram of the circuit structure of the traditional 6T SRAM storage unit is shown. In order to make the 6T structure of the SRAM storage unit have higher stability, the size of the tube can be optimized, but the reading and writing of the tube of the optimized 6T structure of the SRAM storage unit The ability to improve is limited, and due to the competition between the data to be written and the saved data value, the write operation is prone to failure at low voltage; in addition, the traditional 6T-structured SRAM storage unit used in the bit-interleaved structure will cause Reading and writing semi-choice questions

Method used

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  • A sram memory cell circuit with high stability and low static power consumption
  • A sram memory cell circuit with high stability and low static power consumption
  • A sram memory cell circuit with high stability and low static power consumption

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Embodiment Construction

[0022] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0023] The SRAM storage unit circuit proposed by the present invention is a 10T structure, such as figure 1 As shown, it includes the first NMOS transistor MN1, the second NMOS transistor MN2, the third NMOS transistor MN3, the fourth NMOS transistor MN4, the fifth NMOS transistor MN5, the sixth NMOS transistor MN6, the first PMOS transistor MP1, the second PMOS transistor MP2, the third PMOS transistor MP3 and the fourth PMOS transistor MP4, the gate of the third NMOS transistor MN3 is connected to the gate of the third PMOS transistor MP3, the source of the fourth PMOS transistor MP4, the second PMOS transistor MP2 and the fourth NMOS transistor The drain of the transistor MN4 is connected to the gates of the second PMOS transistor MP2, the second NMOS transistor MN2 and the fourth NMOS transistor MN4 and the drains of the first PMOS transistor MP1 and the third PM...

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Abstract

An SRAM storage unit circuit with high stability and low static power consumption belongs to the technical field of integrated circuits. The present invention proposes a kind of SRAM memory unit circuit of 10T structure, combines the reading and writing mode based on this circuit, can make the present invention have high read noise tolerance and writing margin; Because only one bit line in the present invention, and this In the structure of the invention, the first NMOS transistor and the third NMOS transistor are stacked to form a pull-down path, and the second PMOS transistor and the fourth PMOS transistor are stacked to form a pull-up path, which reduces the leakage current in the present invention, thereby reducing the present invention. The static power consumption of the invention; at the same time, the invention can solve the half-selection problem, and can improve the memory soft error rate problem when used in a bit interleaved array structure.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to an SRAM storage unit circuit with high stability and low static power consumption. Background technique [0002] Reducing the power supply voltage can significantly reduce the power consumption of the circuit, especially for high-density integrated circuits such as SRAM (Static Random-Access Memory, static random access memory). However, as the power supply voltage decreases, the memory cells are more significantly affected by process fluctuations, resulting in reduced read / write stability of the memory cells and even errors, which impose higher requirements on the design of the memory cells. At the same time, with the continuous shrinking of the process size and the increase of the storage capacity, the soft error rate of the memory becomes higher and higher. The traditional error correction coding technology can only solve the soft error rate of a single bit, and a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/412G11C11/419
CPCG11C11/412G11C11/419
Inventor 贺雅娟张九柏吴晓清张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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