Wavelength calibration method of atomic fluorescence spectrometer based on digital micro mirror array

Abstract

The invention relates to a wavelength calibration method for an atomic fluorescence spectrometer based on a digital micro mirror array, the method comprises the steps of: a basic function relation between positions of the digital micro mirror array and standard wavelengths is calculated; fitting errors are calculated, and the fitting errors are stored at a corresponding position in a ''wavelengtherror'' Column; for a sample to be tested, a user selects a pre-detection fluorescence wavelength to be measured, the pre-detection fluorescence wavelength is corrected by the wavelength errors storedin the ''wavelength error'' Column to obtain a calibrated wavelength, the calibrated wavelength is substituted into the basic function relation in step 2 for inverse computation to obtain a digital micro mirror inverted array so as to obtain a measurement wavelength of the sample to be tested to obtain an accurate fluorescence intensity value. The accurate fluorescence intensity value can be obtained by substitution of the calibrated wavelength into the basic function relation in the step 2 for inverse computation to obtain the position of the digital micro mirror inverted array for measuringthe measurement wavelength of the sample to be tested. The method can accurately measure the fluorescence intensity information of the wavelength position of the sample to be tested.

Description

technical field [0001] The invention belongs to the technical field of atomic fluorescence spectroscopy, and relates to a wavelength calibration method suitable for an atomic fluorescence spectrometer based on a digital micromirror array. Background technique [0002] In all applications of spectroscopic instruments, wavelength calibration is an indispensable task. Its function is to accurately determine the position of the spectroscopic (or optical selection) components of the instrument and the corresponding relationship between wavelengths. In the general calibration process, curve fitting is often used. [0003] Utility model patent "multi-wavelength calibration system for spectrometer", authorized announcement number: CN202676288U, use the wavelength position and deviation value of 51 calibrated absorption peaks in GasCell to fit the spectral error line, obtain continuous deviation value as the compensation data of the spectrometer, and correct the spectrometer Measured...

AI Technical Summary

Problems solved by technology

[0005] Disadvantages of the existing technology: 1. The influence of multi-wavelength calibration and fitting error is not considered at the same time; 2. The interpolation calculation method is not applied or the interpolation algorithm error is not considered; 3. Each wavelength calibration must be calibrated with full spectrum, and the calculation is redundant and has no targeted

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