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A distance mapping pattern classification method

A technology of mapping patterns and classification methods, applied in character and pattern recognition, instruments, computer parts, etc., can solve the problems of relatively large impact on classification accuracy and neglect of training sample value, and achieve good real-time performance and high classification accuracy. Effect

Inactive Publication Date: 2018-12-11
TIANJIN UNIV
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AI Technical Summary

Problems solved by technology

[0004] The traditional k-nearest neighbor is to select k samples that are close to the test sample in all training samples. This method has two shortcomings: one is that it only considers the role of some training samples that are close to the test sample, while ignoring the effects of other training samples. Second, different k values ​​have a greater impact on classification accuracy, and continuous training is required to determine an ideal k value

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  • A distance mapping pattern classification method
  • A distance mapping pattern classification method
  • A distance mapping pattern classification method

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Embodiment Construction

[0022] Considering the problems existing in the traditional k-nearest neighbor method, the present invention uses the extracted sample features to calculate the Euclidean distance between the sample to be classified and all the training samples, omits the determination of the k value, and directly determines the mathematical relationship between the Euclidean distance and the classification result through function mapping. relationship, and then propose a distance mapping classifier, that is, the Euclidean distance (independent variable) between the sample to be classified and all training samples is obtained through mathematical calculation (function mapping) to obtain the classification result (dependent variable) of the sample to be classified.

[0023] The invention provides a distance mapping classification method. The basic principle of distance mapping is to map different categories of sample features to different category labels.

[0024] The distance map classifier co...

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Abstract

The invention relates to a distance mapping pattern classification method. The established distance mapping classifier comprises four parts, namely an input layer, a hidden layer 1, a hidden layer 2 and an output layer. The input layer comprises d neuron nodes, and each node represents a feature vector of a training or test sample. The feature vector set of the extracted samples is used as the input layer of the distance mapping classifier. The hidden layer 1 contains N neuron nodes, N representing the total number of training samples; and calculates the Euclidean distance between the input eigenvector and the eigenvectors of N training samples as the hidden layer 1. The hidden layer 2 consists of L neuron nodes. The hidden layer 1 and the hidden layer 2 can be connected by linear activation function. The two parameter matrices of the linear activation function are the connection weights and offsets of the hidden layer 1 and 2 respectively. When the classifier model is used to classifythe test samples, the output matrix can be calculated directly by using the transformation matrix obtained from the training.

Description

technical field [0001] The invention relates to a method for (artificial intelligence) pattern recognition and classification. Background technique [0002] At present, pattern classification is widely used in various industries such as medicine, intelligent transportation, weather forecast, and liquor recognition. To this end, many pattern classification methods have been presented. Generally, pattern classification methods can be summarized into two types, namely simple classifiers and complex classifiers. Simple classifiers, such as k-nearest neighbors, Bayesian, Fisher, and extreme learning machines, are suitable for fast classification requirements; while complex classifiers, such as support vector machines, neural networks, and deep learning, have poor real-time performance. [0003] Different classifiers have different characteristics. Take two simple classifiers as examples, namely k-nearest neighbor {B.K.Samanthula, Y.Elmehdwi, and J.Wei, "k-nearest neighbor clas...

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Application Information

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IPC IPC(8): G06K9/62
CPCG06F18/285G06F18/24
Inventor 孟庆浩侯惠让
Owner TIANJIN UNIV
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