In-situ tensile experiment device for scanning electron microscope

Abstract

The invention provides an in-situ tensile experiment device for a scanning electron microscope. The in-situ tensile experiment device comprises a base; vertical lifting rods are fixedly installed at the four corners of the top face of the base respectively, the top ends of the four lifting rods are fixedly connected through a square block, and the square block and the base are mutually parallel; guiding grooves are formed in the front end and the back end of the top face of the base respectively, two guiding blocks are arranged in each guiding groove in a matched mode, and every two guiding blocks which are located on the same side of the base are fixedly connected through a long strip block; and the two long strip blocks are mutually parallel, long strip-shaped grooves are formed in the opposite faces of the two long strip blocks respectively, three movable blocks are arranged in each groove in a matched mode, and the three movable blocks located in the same groove are arranged sequentially from front to back. A fourth nut and a ball bearing are fixedly connected through a connecting rod, a second bevel gear is fixedly connected with the inner ring of the ball bearing, then the second bevel gear can be driven to move when the fourth nut moves, and therefore a moving block can do horizontal reciprocating motion.

Description

technical field [0001] The invention belongs to the field of mechanical devices, in particular to an in-situ tensile test device for a scanning electron microscope. Background technique [0002] At present, in the tensile test, usually only the tensile test can be performed on the plate, and the position of the scanning electron microscope is fixed, and the experimental data obtained in the experiment is less, so it is inconvenient to use. Contents of the invention [0003] The invention provides an in-situ stretching test device for a scanning electron microscope, which is used to solve the defects in the prior art. [0004] The present invention is achieved through the following technical solutions: [0005] The in-situ tensile test device for scanning electron microscope includes a base, and the four corners of the top surface of the base are respectively fixed with vertical lifting rods, and the tops of the four lifting rods are fixedly connected by a square block. G...

AI Technical Summary

Problems solved by technology

[0002] At present, in the tensile test, usually only the tensile test can be performed on the plate, and the position of the scanning electron microscope is fixed, and the experimental data obtained in the experiment is less, so it is more inconvenient to use

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