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T/R component phase shift accuracy testing method and system based on trigger function

A technology of precision testing and phase shifting, which is applied in the testing field, can solve problems such as reducing test efficiency, and achieve the effects of improving test efficiency, speeding up scanning speed, and speeding up triggering speed

Active Publication Date: 2018-12-18
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The frequent communication between the industrial computer, the state controller and the vector network analyzer seriously reduces the test efficiency

Method used

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  • T/R component phase shift accuracy testing method and system based on trigger function
  • T/R component phase shift accuracy testing method and system based on trigger function
  • T/R component phase shift accuracy testing method and system based on trigger function

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Embodiment Construction

[0032] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0033] It should be pointed out that the following detailed description is exemplary and is intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0034] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combina...

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PUM

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Abstract

The invention discloses a T / R component phase shift accuracy testing method and system based on a trigger function. The method comprises the following steps that: after a state controller receives a phase shift starting instruction, continuously outputting N states of phase shift instructions to the T / R component; after each state of phase shift instruction takes effect, outputting a measurement synchronization signal to the "external trigger input" port of a vector network analyzer to trigger scanning; monitoring the measurement finishing signal of the "external trigger ready" port of the vector network analyzer in real time; and taking the current measurement finishing signal of the vector network analyzer as a next state of phase shift instruction beginning signal. The method has the beneficial effects that the frequency for an industrial personal computer to read the test data of the vector network analyzer is changed into one from 64, and testing efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method and system for testing the phase-shifting accuracy of a T / R component based on a trigger function. Background technique [0002] Phase shift accuracy is an important index to measure T / R components. At present, it is generally carried out in the way of industrial computer program-controlled state controller and vector network analyzer. The traditional phase-shifting accuracy test system flow is as follows: figure 1 As shown, the program-controlled vector network analyzer inputs the excitation signal to the T / R component, the program-controlled state controller performs a phase-shift operation on the T / R component, the program-controlled vector network analyzer starts scanning, and the program-controlled vector network analyzer obtains a single State shift phasor test data. Repeat to complete the 64-state phase-shift test. [0003] In the above test process, the indust...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 徐宝令丁志钊公承乔宏志展利
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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