Ultrahigh-spectral transmittance etalon and visibility measurement device

Abstract

The invention discloses an ultrahigh-spectral transmittance etalon, which comprises a fixed part and light filters, wherein the light filters are of a sector structure, are alternately arranged on thefixed part and are used for filtering or shielding continuous light emitted from a light source. The upper limit of measurement of the transmittance is improved or the lower limit of measurement of the transmittance is reduced through alternately arranging at least one light filter with fixed transmittance on the fixed part and setting the sector area / central angle ratios of the light filters, the measurement range of the spectral transmittance etalon is greatly improved, meanwhile, the measurement uncertainty on the transmittance is greatly reduced, the spectral flatness of a transmittance curve is improved and the measurement uniformity on the transmittance is improved.

Description

technical field

[0001] The invention relates to the technical field of optical metrology, in particular to an ultra-high spectral transmittance standard measuring tool and a visibility measuring device. Background technique

[0002] Transmittance is a very important optical parameter in the field of optical metrology technology and an important parameter for evaluating optical performance. It is often used in optical components, optical films, and visibility measuring instruments. With the continuous progress and development of science and technology, laser technology and optical thin film technology have been developed rapidly, and the requirements for material transmittance performance are getting higher and higher, which is higher than 0.995. Visibility refers to the maximum distance at which objects can be identified from the background. It is a weather indicator to understand the stability and vertical structure of the atmosphere, and it is also an extremely important f...

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