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A visual detection method for electronic connector pin process defects

An electronic connector, visual inspection technology, applied in the direction of optical testing flaws/defects, instruments, measuring devices, etc., can solve problems such as lighting difficulties, and achieve the effect of improving accuracy

Active Publication Date: 2021-05-04
SHANGHAI LAIMU ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This is a very difficult task for a vision system using a monochrome camera, since the gray levels of the image are practically the same for different metal coatings
Although the camera of the color vision system can successfully distinguish these different metal coatings, the problem of lighting difficulties still exists due to the irregular angles and reflection effects of the coating surface

Method used

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  • A visual detection method for electronic connector pin process defects
  • A visual detection method for electronic connector pin process defects
  • A visual detection method for electronic connector pin process defects

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Embodiment Construction

[0025]The present invention will be described in detail below with reference to the accompanying drawings and specific examples. The present embodiment is implemented in terms of the technical solution of the present invention, and a detailed embodiment and a specific operation process are given, but the scope of the invention is not limited to the following examples.

[0026]The present invention provides an electronic connector push process defective visual detection method, including the following steps: 1) Access to electronic connector pin electroplating surface images; 2) Based on the angle tensile operation theory from electronic connector pin electroplating surface images Extract image characteristics; 3) Defects in the image feature. The present invention can obtain various irregularities, inconsistent defects, such as fine scratches, and pinholes, etc., and change the characteristic information of the image in the image in the image.

[0027]Such asfigure 1 As shown, the specifi...

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Abstract

The invention relates to a visual detection method for defects in the pin process of an electronic connector, comprising the following steps: 1) acquiring an image of the electroplating surface of the pin of the electronic connector; Extracting image features from the image; 3) judging whether there is a defect based on the image features. Compared with the prior art, the present invention has the advantages of being able to effectively process important features in images, thereby improving the detection accuracy of electronic connector pin defects and the like.

Description

Technical field[0001]The present invention relates to the field of electronic connector insert defect detection, in particular, to an electronic connector push process defect visual detection method.Background technique[0002]There are a wide variety of electronic connector in the connector process, where the connector is pressing the plating section after the connector punch is completed. At this stage, the electron contact surface of the connector will be plated with various metal coatings, which will produce some problems, such as distortion of the pin, broken or deformed, and also fed into electroplating in a stamped pin Small scratches and pinholes occur during the process of the device.[0003]However, for most machine vision-suppliers, many quality defects in the electroplating process are also "penalty-based" in the detection system. The electronic connector manufacturer wants to detect the system to detect various inconsistent defects such as fine scratches and pinholes on the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/95
CPCG01N21/8851G01N21/95G01N2021/8887
Inventor 戴琪季向荣朱新爱
Owner SHANGHAI LAIMU ELECTRONICS