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Moving object measuring error compensation method based on structured light

A technology for moving objects and measuring errors, applied to measuring devices, using optical devices, instruments, etc., can solve the problems of low measurement error compensation accuracy, low phase error estimation accuracy, and insufficient consideration of the impact, etc., so as to improve the compensation accuracy and improve the The effect of measuring accuracy, expanding application scenarios and scope of application

Active Publication Date: 2018-12-25
TSINGHUA UNIV
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Problems solved by technology

However, this method assumes that the object is moving at a uniform speed, and does not fully consider the influence of non-uniform motion on the phase error. At the same time, the phase error is regarded as a constant in the neighborhood, and the spatial distribution characteristics of the phase error are not considered, so the estimation accuracy of the phase error is low. , resulting in low accuracy of compensation for measurement errors of moving objects, so it is necessary to study a high-precision compensation method for measurement errors of moving objects

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  • Moving object measuring error compensation method based on structured light
  • Moving object measuring error compensation method based on structured light
  • Moving object measuring error compensation method based on structured light

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[0016] The present invention proposes a method for compensating measurement errors of moving objects based on structured light. The present invention will be described in further detail below in conjunction with the accompanying drawings and specific examples. The following examples are used to illustrate the present invention, but not to limit the scope of the present invention.

[0017] The present invention proposes a method for compensating measurement errors of moving objects based on structured light. The method includes the following steps:

[0018] 1) Build a three-dimensional measurement system based on structured light, the system structure is as follows figure 1 Shown, comprise: camera 11, projector 12, support 13 and computer 14; Wherein camera 11 and projector 12 are respectively fixed on the support 13, camera 11 and projector 12 connect computer 14 by data line respectively; During work, all The projector is used to project encoding patterns (including high-freq...

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Abstract

The invention provides a moving object measuring error compensation method based on structured light, and belongs to the field of moving object measuring error compensation. The method comprises the steps that firstly, a three-dimensional measuring system based on the structured light is established; the three-dimensional measuring system is utilized to calibrate a camera and a projector, and thusinternal parameters of the camera and the projector and the conversion relationship between the camera and the projector are obtained; a to-be-measured moving object moves randomly, the projector sequentially projects three high-frequency phase shift sinusoidal patterns and a plurality of unpacking patterns to the surface of the to-be-measured moving object, and the camera collects a reflection pattern corresponding to each pattern on the surface of the to-be-measured moving object; all the reflection patterns are decoded to obtain a phase image; phase error of all pixel points in the image is estimated and compensated, and the compensated phase image is obtained; and by utilizing the compensated phase image, the three-dimensional shape after compensation of the to-be-measured moving object is finally obtained through triangulation. According to the moving object measuring error compensation method, the measuring error compensation precision of the non-uniform moving object is improved, and high-precision measuring of the moving object can be achieved.

Description

technical field [0001] The invention belongs to the field of measurement error compensation of moving objects, in particular to a method for compensating measurement errors of moving objects based on structured light. Background technique [0002] Three-dimensional measurement based on structured light is a technology that calculates the three-dimensional shape of the object to be measured by projecting a coded pattern to the object to be measured, using the camera to capture the pattern, and decoding it to obtain coordinate information. This technology is widely used in reverse engineering, industrial testing, medical services and many other fields. However, in some scenarios where the object to be measured moves relative to the measurement system, such as workpiece detection on a production line, the phase error caused by the motion of the object will cause errors in the measurement results, which limits the application range of three-dimensional measurement based on struc...

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Application Information

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IPC IPC(8): G01B11/25
CPCG01B11/002G01B11/254
Inventor 徐静陈恳陈睿吴丹宋立滨
Owner TSINGHUA UNIV