Double-layer grid mesh spherical secondary electronic collector
A technology of secondary electrons and collectors, applied in the direction of material analysis using measurement of secondary emissions, can solve problems such as adverse effects, test errors, and secondary electrons cannot be collected, achieve shielding interference, improve receiving efficiency, reduce The effect of signal distortion
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[0024] In order to be able to understand the above-mentioned objectives, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other if they do not conflict with each other.
[0025] In the following description, many specific details are explained in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from the scope described here. Therefore, the protection scope of the present invention is not disclosed below. Limitations of specific embodiments.
[0026] Such as figure 1 Shown is the overall side view of the double-layer grid tennis-shaped secondary electron collector. The double-layer grid tennis-shaped secondary electron collector is...
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